K4S280832M
CMOS SDRAM
128Mbit SDRAM
4M x 8Bit x 4 Banks
Synchronous DRAM
LVTTL
Revision 0.0
Aug. 1999
Samsung Electronics reserves the right to change products or specification without notice.
Rev. 0.0 Aug. 1999
K4S280832M
4M x 8Bit x 4 Banks Synchronous DRAM
FEATURES
• JEDEC standard 3.3V power supply
• LVTTL compatible with multiplexed address
• Four banks operation
• MRS cycle with address key programs
-. CAS latency (2 & 3)
-. Burst length (1, 2, 4, 8 & Full page)
-. Burst type (Sequential & Interleave)
• All inputs are sampled at the positive going edge of the system
clock.
• Burst read single-bit write operation
• DQM for masking
• Auto & self refresh
• 64ms refresh period (4K cycle)
CMOS SDRAM
GENERAL DESCRIPTION
The K4S280832M is 134,217,728 bits synchronous high data
rate Dynamic RAM organized as 4 x 4,194,304 words by 8 bits,
fabricated with SAMSUNG′s high performance CMOS technol-
ogy. Synchronous design allows precise cycle control with the
use of system clock I/O transactions are possible on every clock
cycle. Range of operating frequencies, programmable burst
length and programmable latencies allow the same device to be
useful for a variety of high bandwidth, high performance mem-
ory system applications.
ORDERING INFORMATION
Part No.
K4S280832M-TC/L80
K4S280832M-TC/L1H
K4S280832M-TC/L1L
K4S280832M-TC/L10
Max Freq.
125MHz(CL=3)
100MHz(CL=2)
100MHz(CL=3)
66MHz(CL=2 &3)
LVTTL
54pin
TSOP(II)
Inter-
Package
FUNCTIONAL BLOCK DIAGRAM
I/O Control
LWE
LDQM
Data Input Register
Bank Select
4M x 8
Sense AMP
4M x 8
4M x 8
4M x 8
Refresh Counter
Output Buffer
Row Decoder
Row Buffer
DQi
Address Register
CLK
ADD
Column Decoder
Col. Buffer
Latency & Burst Length
LRAS
LCBR
LCKE
LRAS
LCBR
LWE
LCAS
Timing Register
Programming Register
LWCBR
LDQM
CLK
CKE
CS
RAS
CAS
WE
DQM
* Samsung Electronics reserves the right to change products or specification without notice.
Rev. 0.0 Aug. 1999
K4S280832M
PIN CONFIGURATION
(Top view)
V
DD
DQ0
V
DDQ
N.C
DQ1
V
SSQ
N.C
DQ2
V
DDQ
N.C
DQ3
V
SSQ
N.C
V
DD
N.C
WE
CAS
RAS
CS
BA0
BA1
A10/AP
A0
A1
A2
A3
V
DD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
V
SS
DQ7
V
SSQ
N.C
DQ6
V
DDQ
N.C
DQ5
V
SSQ
N.C
DQ4
V
DDQ
N.C
V
SS
N.C/RFU
DQM
CLK
CKE
N.C
A11
A9
A8
A7
A6
A5
A4
V
SS
CMOS SDRAM
54Pin TSOP (II)
(400mil x 875mil)
(0.8 mm Pin pitch)
PIN FUNCTION DESCRIPTION
Pin
CLK
CS
Name
System clock
Chip select
Input Function
Active on the positive going edge to sample all inputs.
Disables or enables device operation by masking or enabling all inputs except
CLK, CKE and DQM
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior to new command.
Disable input buffers for power down in standby.
Row/column addresses are multiplexed on the same pins.
Row address : RA
0
~ RA
11
, Column address : CA
0
~ CA
9
Selects bank to be activated during row address latch time.
Selects bank for read/write during column address latch time.
Latches row addresses on the positive going edge of the CLK with RAS low.
Enables row access & precharge.
Latches column addresses on the positive going edge of the CLK with CAS low.
Enables column access.
Enables write operation and row precharge.
Latches data in starting from CAS, WE active.
Makes data output Hi-Z, t
SHZ
after the clock and masks the output.
Blocks data input when DQM active.
Data inputs/outputs are multiplexed on the same pins.
Power and ground for the input buffers and the core logic.
Isolated power supply and ground for the output buffers to provide improved noise
immunity.
This pin is recommended to be left No Connection on the device.
CKE
Clock enable
A
0
~ A
11
BA
0
~ BA
1
RAS
CAS
WE
DQM
DQ
0
~
7
V
DD
/V
SS
V
DDQ
/V
SSQ
N.C/RFU
Address
Bank select address
Row address strobe
Column address strobe
Write enable
Data input/output mask
Data input/output
Power supply/ground
Data output power/ground
No connection
/reserved for future use
Rev. 0.0 Aug. 1999
K4S280832M
ABSOLUTE MAXIMUM RATINGS
Parameter
Voltage on any pin relative to Vss
Voltage on V
DD
supply relative to Vss
Storage temperature
Power dissipation
Short circuit current
Symbol
V
IN
, V
OUT
V
DD
, V
DDQ
T
STG
P
D
I
OS
Value
-1.0 ~ 4.6
-1.0 ~ 4.6
-55 ~ +150
1
50
CMOS SDRAM
Unit
V
V
°C
W
mA
Note :
Permanent device damage may occur if "ABSOLUTE MAXIMUM RATINGS" are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
DC OPERATING CONDITIONS
Recommended operating conditions (Voltage referenced to V
SS
= 0V, T
A
= 0 to 70°C)
Parameter
Supply voltage
Input logic high voltage
Input logic low voltage
Output logic high voltage
Output logic low voltage
Input leakage current (Inputs)
Input leakage current (I/O pins)
Symbol
V
DD
, V
DDQ
V
IH
V
IL
V
OH
V
OL
I
IL
I
IL
Min
3.0
2.0
-0.3
2.4
-
-1
-1.5
Typ
3.3
3.0
0
-
-
-
-
Max
3.6
V
DDQ
+0.3
0.8
-
0.4
1
1.5
Unit
V
V
V
V
V
uA
uA
1
2
I
OH
= -2mA
I
OL
= 2mA
3
3,4
Note
Notes :
1. V
IH
(max) = 5.6V AC.The overshoot voltage duration is
≤
3ns.
2. V
IL
(min) = -2.0V AC. The undershoot voltage duration is
≤
3ns.
3. Any input 0V
≤
V
IN
≤
V
DDQ
,
Input leakage currents include Hi-Z output leakage for all bi-directional buffers with Tri-State outputs.
4. Dout is disabled, 0V
≤
V
OUT
≤
V
DDQ.
CAPACITANCE
Clock
(V
DD
= 3.3V, T
A
= 23°C, f = 1MHz, V
REF
= 1.4V
±
200 mV)
Symbol
C
CLK
C
IN
C
ADD
C
OUT
Min
2.5
2.5
2.5
4
Max
4
5
5
6.5
Unit
pF
pF
pF
pF
Parameter
RAS, CAS, WE, CS, CKE, DQM
Address
DQ
0
~ DQ
3
Rev. 0.0 Aug. 1999
K4S280832M
DC CHARACTERISTICS
(Recommended operating condition unless otherwise noted, T
A
= 0 to 70°C)
Parameter
Symbol
Test Condition
Burst length = 1
t
RC
≥
t
RC
(min)
I
OL
= 0 mA
CKE
≤
V
IL
(max), t
CC
= 15ns
CKE & CLK
≤
V
IL
(max), t
CC
=
∞
CKE
≥
V
IH
(min),CS
≥
V
IH
(min),t
CC
=15ns
Input signals are changed one time during 30ns
CKE
≥
V
IH
(min), CLK
≤
V
IL
(max), t
CC
=
∞
Input signals are stable
CKE
≤
V
IL
(max), t
CC
= 15ns
CKE & CLK
≤
V
IL
(max), t
CC
=
∞
CKE
≥
V
IH
(min), CS
≥
V
IH
(min), t
CC
= 15ns
Input signals are changed one time during 30ns.
CKE
≥
V
IH
(min), CLK
≤
V
IL
(max), t
CC
=
∞
Input signals are stable
I
OL
= 0 mA
Page burst
t
CCD
= 2CLKs
t
RC
≥
t
RC
(min)
CKE
≤
0.2V
C
L
3
2
150
115
CAS
Latency
CMOS SDRAM
Version
-80
120
-1H
110
1
1
15
-1L
110
-10
105
Unit
Note
Operating current
(One bank active)
Precharge standby current in
power-down mode
I
CC1
I
CC2
P
I
CC2
PS
I
CC2
N
mA
1
mA
Precharge standby current in
non power-down mode
I
CC2
NS
Active standby current in
power-down mode
I
CC3
P
I
CC3
PS
I
CC3
N
I
CC3
NS
mA
7
5
5
30
20
125
125
200
1.5
800
125
115
125
115
165
mA
mA
mA
uA
1
2
3
4
mA
mA
mA
Active standby current in
non power-down mode
(One bank active)
Operating current
(Burst mode)
Refresh current
Self refresh current
I
CC4
I
CC5
I
CC6
Notes :
1. Measured with outputs open.
2. Refresh period is 64ms.
3. K4S280832M-TC**
4. K4S280832M-TL**
Rev. 0.0 Aug. 1999
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