Specification
Drawing No.
Issued Date
EQM08-5OC-00AG170-00
Nov-05-2012
To Mouser
Note: In case of specification change, KYOCERA Part Number also will be changed.
Customer Part Number
KYOCERA Part Number
KC5032Axx.xxxxCM0E00
Remarks:
This product is Pb-Free and RoHS compliant.
Moisture Sensitivity Level (MSL): Level1
Customer Acceptance
Please sign here and send one copy back to us.
Signature:
Accepted Date:
Seller
KYOCERA Corporation
6 Takeda Tobadono-cho, Fushimi-ku, Kyoto,
Japan 612-8501
TEL: +81-75-604-3500
FAX: +81-75-604-3501
Manufacturer
KYOCERA Crystal Device Corporation
1-8-1 Izumihon-cho, Komae, Tokyo,
Japan 201-8648
TEL: +81-3-5497-3110
FAX: +81-3-5497-3208
Quality
Assurance
Design Department
KYOCERA Crystal Device Corporation
Nagano Okaya Plant
Oscillator Division Engineering Department
Clock Oscillator Application Engineering Section
Approved by
Checked by
Issued by
M. Morimoto
T. Koyanagi
Y. Saito
T. Asakura
DocNo:
EQM07-5OC-003AA0E-01
Drawing No.
EQM08-5OC-00AG170-00
Revision History
Rev. No.
Description of revise
First Edition
Issued Date
Approved by
T. Koyanagi
Checked by
Y. Saito
Issued by
T. Asakura
00
Nov-05-2012
DocNo:
EQM07-5OC-003AA0E-01
Drawing No.
EQM08-5OC-00AG170-00
(1/5)
1. Scope
This specification shall be defined of the Clock Oscillator for the integrated circuits (ICs).
2. Customer Part Number
3. KYOCERA Part Number
KC5032Axx.xxxxCM0E00
4. Electrical Characteristics
4-1. Absolute Maximum Rating
Item
Power Supply Voltage
Input Voltage
Storage Temperature Range
Symbol
V
CC
V
IN
T
STG
Rated Value
-0.5 to +7.0
-0.5 to V
CC
+0.5
-55 to +125
Units
V
V
°C
Note:
If the part is used beyond absolute maximum ratings, it may cause internal destruction. The part should be used under the
recommended operating conditions the reliability of this part may be damaged if those conditions are exceeded.
4-2. Recommended Operating Conditions
Item
Power Supply Voltage
Input Voltage
Operating Temperature Range
Symbol
V
CC
V
IN
T
OPR
Min
1.6
0
-10
Typ
3.3
---
25
Max
5.5
V
CC
+70
Units
V
V
°C
Remarks
4-3. Electrical Characteristics
Symbol
Item
Frequency Range
Frequency Tolerance
Current Consumption
(Loaded/ 1.6≤V
CC
≤2.0V)
Min
1.789
-50
---
---
---
---
---
---
---
---
---
---
---
---
---
45
---
---
---
---
---
90% V
CC
Typ
---
---
---
---
---
---
---
---
---
---
---
---
---
---
---
50
---
---
---
---
---
---
---
---
---
---
---
---
---
---
---
---
Max
50
+50
3.5
4.5
5.0
4.0
5.0
6.0
5.0
6.0
7.0
7.0
8.0
9.5
10
55
8.0
7.0
6.0
5.0
10% V
CC
Units
MHz
ppm
Remarks
Include initial tolerance, operating temperature
range, rated power supply voltage change,
load change, aging (1year @25°C), shock and
vibration
1.8≤ f
0
≤20MHz
20< f
0
≤40MHz
40< f
0
≤50MHz
1.8≤ f
0
≤20MHz
20< f
0
≤40MHz
40< f
0
≤50MHz
1.8≤ f
0
≤20MHz
20< f
0
≤40MHz
40< f
0
≤50MHz
1.8≤ f
0
≤20MHz
20< f
0
≤40MHz
40< f
0
≤50MHz
F
O
F_
tol
Current Consumption
(Loaded/ 2.0<V
CC
≤2.8V)
I
CC
Current Consumption
(Loaded/ 2.8<V
CC
≤3.63V)
mA
Current Consumption
(Loaded/ 4.5<V
CC
≤5.5V)
Standby Current
Symmetry(Duty Ratio)
Rise Time/ Fall Time
(10% V
CC
to 90% V
CC
)
I_
std
SYM
Tr/ Tf
V
OL
V
OH
CL
V
IL
V
IH
t
_dis
t
_ena
t
_sta
J
Sigma
J
PK-PK
µA
%
ns
V
pF
V
ns
ms
ms
ps
@ 50% V
CC
1.6≤V
CC
≤2.0V
2.0<V
CC
≤2.8V
2.8<V
CC
≤3.63V
4.5<V
CC
≤5.5V
I
OL
= 4mA
I
OH
=-4mA
CMOS
Output Voltage-“L”
Output Voltage-“H”
Output Load
Input Voltage-“L”
Input Voltage-“H”
Output Disable Time
Output Enable Time
Start-up Time
1 Sigma Jitter*
Peak to Peak Jitter*
---
---
70% V
CC
---
15
30% V
CC
---
---
---
---
---
---
---
---
150
5
10
8
5
80
50
@Minimum operating voltage to be 0sec
1.8≤ f
0
≤40MHz
40< f
0
≤50MHz
1.8≤ f
0
≤40MHz
40< f
0
≤50MHz
Note: All electrical characteristics have defined on the maximum loaded and recommended operating conditions.
* Based on Time Interval Analyzer "Wavecrest DTS-2079" with VISI 6.3.1.
Table 1
Doc.NO:
EQM07-5OC-003AA0E-01
Drawing No.
EQM08-5OC-00AG170-00
(2/5)
4-4. Measurement Condition
The reference temperature shall be 25±2ºC. The measurement shall be performed at the
temperature range of 5 ºC to 35 ºC unless otherwise the result is doubtful.
4-5. Measurement Circuit
The electrical characteristics shall be measured by test circuit "Fig. 1". Also jitter shall be
measured by test circuit "Fig. 3".
4-6. Clock Timing Chart
The clock timing chart is "Fig. 2".
Test Point
Pad4
A
+
Power
Supply
V
0.01µF
E/D Control
GND
Tr
V
CC
Tf
Pad3
Oscillator
Pad1
Pad2
CL
V
OL
T
1
T
0
= 1/f
OUT
V
OH
90%V
CC
50%V
CC
-
10%V
CC
Symmetry = T
1
/ T
0
X100(%)
Note: CL includes probe and test fixture capacitance
Fig.1 Test Circuit
Clock Oscillator Test Fixture
Pad4
+
Power
Supply
Pad1
10µF 0.01µF
E/D Control
Pad3
50 ohm SMA Termination
Fig.2 Clock Timing Chart (C-MOS Output)
<Measurement Conditions>
WaveCrest
DTS-2079
ATT 6dB
Oscillator
Pad2
-
50 ohm COAX with SMA Connectors
Time Interval Analyzer
WaveCrest DTS-2079
Jitter analysis software
VISI 6.3.1
DTS timer calibration
Over 30minnites warm-up
Extend 30minites calibration
Jitter histogram conditions (Tail-fit)
More than 50,000cyc Hits
Bit Error Ratio (BER) –12 (14sigma)
Fig.3 Jitter Test Circuit
5. Dimensions and Marking
5.0
0.1
0.5
1.2
In case of made in Philippines
Pad1 Indication
16.000
KCCCG
Output Frequency
Manufacturing Date Code
3.2
1.2
#3 #4
#2 #1
0.9
2.5
In case of made in Japan
Pad1 Indication
Output Frequency
16.000
KCCCG
Manufacturing Date Code
(e.g. Frequency: 16MHz)
1.0
Output Frequency
The output frequency is six-digit including a decimal point.
The frequency greater than the number of digits have
rounded down. (E.g. 14.31818MHz "14.318”)
Plating Ni+Au
Tolerance: +/-0.1
Unit:(mm)
0.5
Manufacturing Date Code
Year
Code
Year
Code
L
M
N
P
Q
R
S
T
V
W
and
Month
1
2
3
4
5
6
7
8
9
10
11
12
Code
1
2
3
4
5
6
7
8
9
A
B
C
Day
1
2
3
4
5
6
7
8
9
10
Code
1
2
3
4
5
6
7
8
9
A
Day
11
12
13
14
15
16
17
18
19
20
Code
B
C
D
E
F
G
H
J
K
L
Day
21
22
23
24
25
26
27
28
29
30
31
Code
M
N
P
Q
R
S
T
V
W
X
Y
2001
A
2011
2002
B
2012
2003
C
2013
2004
D
2014
2005
E
2015
2006
F
2016
2007
G
2017
2008
H
2018
2009
J
2019
2010
K
2020
It repeats from A in 2021
afterwards.
Pad arrangement
1
Enable/Disable
2
Case GND
3
Output
4
V
CC
Enable/Disable Function
Pad1
Pad3 (Output)
OPEN
Active
“H” Level
Active
“L” Level
High Z (No-Oscillation)
e.g. :”C46” means “Apr-6-2003”
Table 2
Doc.NO:
EQM07-5OC-003AA0E-01
Drawing No.
EQM08-5OC-00AG170-00
(3/5)
6. Parts Numbering Guide
KC5032A 25.0000 C M 0 E 00
A
B
C D E F G
Symmetry (Duty Ratio) and Enable/Disable Function
E: Symmetry: 45% to 55% with Stand-by Function
G. Suffix for Individual Requirements
(
STD Specification is “00”
)
A. Series (SMD Oscillator)
B. Output Frequency (E.g. 25.0000MHz)
C. Output
C: C-MOS
D. Supply Voltage
M: 1.8V/ 2.5V/ 3.3V/ 5.0V Compatible
E. Frequency Tolerance*
0: ±50ppm
F.
Packing (Tape & Reel 1,000pcs/Reel)
*Over All Conditions:
Include initial tolerance, operating temperature range,
rated power supply voltage change, load change,
aging (1year @25°C), shock and vibration
7. Environmental Characteristics
Items
7-1. Solderability
Conditions
Criteria of Acceptance
Soaking:
Dipped potion:
245±5°C, 5.0±0.5sec
Minimum 95% coverage
Reflow soldering:
Peak 260°C max, 10sec, Twice max
7-2. Soldering Heat
Soldering iron:
Without looseness or crack etc.
Resistance
380±5°C, 3+1/-0sec,
Twice as one time for four pads
10cycles:
7-3. Temperature Cycle
-55°C to +125°C (30minuts each/ cycle)
5 times
7-4. Mechanical
2
14,750m/sec (1,500G), Duration of pulse 0.5msec
Shock (Pulse)
(MIL-STD-883D-2002.3 Condition B)
4 times each axis X, Y, Z:
Clause 7-10 shall be satisfied.
20 to 2,000Hz and 2,000Hz to 20Hz/cycle
7-5. Vibration
2
Peak acceleration 196m/sec (20G)
(MIL-STD-883D-2007.2 Condition A)
1000 hours:
7-6. High Temperature
Temperature: 85+5/-3°C
1000 hours:
7-7. Low Temperature
Temperature: -40+5/-3°C
10 cycles:
7-8. Humidity Cycle
Based on 1004 specifications
Clause 7-1 shall be satisfied.
(MIL-STD-883D-1004.7)
7-9. Hermeticity 1
Soaking:
No bubbles appeared
(Gross leak)
125°C, 5minutes
7-10. Hermeticity 2
Measured by Helium Detector Equipment
5x10
-9
Pa m
3
/sec max
(Fine leak)
(MIL-STD-883D-1014.10 Condition A1)
After each testing, the parts shall be subjected to standard atmospheric conditions more than 2 hours. After that, the
electrical characteristics shall be measured. The result of the test shall be satisfied
Table 1.
Table 3
Doc.NO:
EQM07-5OC-003AA0E-01
京公网安备 11010802033920号
EEWORLD
