EEWORLDEEWORLDEEWORLD

Part Number

Search

EPF6024AQC240-1

Description
FPGA - Field Programmable Gate Array FPGA - Flex 6000 196 LABs 199 IOs
CategoryProgrammable logic devices    Programmable logic   
File Size378KB,52 Pages
ManufacturerAltera (Intel)
Download Datasheet Parametric View All

EPF6024AQC240-1 Online Shopping

Suppliers Part Number Price MOQ In stock  
EPF6024AQC240-1 - - View Buy Now

EPF6024AQC240-1 Overview

FPGA - Field Programmable Gate Array FPGA - Flex 6000 196 LABs 199 IOs

EPF6024AQC240-1 Parametric

Parameter NameAttribute value
Is it lead-free?Contains lead
Is it Rohs certified?incompatible
MakerAltera (Intel)
Parts packaging codeQFP
package instructionFQFP, QFP240,1.3SQ,20
Contacts240
Reach Compliance Codeunknown
ECCN code3A991
Other featuresCAN ALSO BE USED 24000 LOGIC GATES
maximum clock frequency172 MHz
JESD-30 codeS-PQFP-G240
JESD-609 codee0
length32 mm
Humidity sensitivity level3
Dedicated input times4
Number of I/O lines199
Number of entries199
Number of logical units1960
Output times199
Number of terminals240
Maximum operating temperature85 °C
Minimum operating temperature
organize4 DEDICATED INPUTS, 199 I/O
Output functionMACROCELL
Package body materialPLASTIC/EPOXY
encapsulated codeFQFP
Encapsulate equivalent codeQFP240,1.3SQ,20
Package shapeSQUARE
Package formFLATPACK, FINE PITCH
Peak Reflow Temperature (Celsius)220
power supply2.5/3.3,3.3 V
Programmable logic typeLOADABLE PLD
Certification statusNot Qualified
Maximum seat height4.1 mm
Maximum supply voltage3.6 V
Minimum supply voltage3 V
Nominal supply voltage3.3 V
surface mountYES
technologyCMOS
Temperature levelOTHER
Terminal surfaceTin/Lead (Sn/Pb)
Terminal formGULL WING
Terminal pitch0.5 mm
Terminal locationQUAD
Maximum time at peak reflow temperature30
width32 mm
Base Number Matches1
FLEX 6000
®
Programmable Logic
Device Family
Data Sheet
March 2001, ver. 4.1
Features...
Provides an ideal low-cost, programmable alternative to high-
volume gate array applications and allows fast design changes
during prototyping or design testing
Product features
Register-rich, look-up table- (LUT-) based architecture
OptiFLEX
®
architecture that increases device area efficiency
Typical gates ranging from 5,000 to 24,000 gates (see
Table 1)
Built-in low-skew clock distribution tree
100% functional testing of all devices; test vectors or scan chains
are not required
System-level features
In-circuit reconfigurability (ICR) via external configuration
device or intelligent controller
5.0-V devices are fully compliant with peripheral component
interconnect Special Interest Group (PCI SIG)
PCI Local Bus
Specification, Revision 2.2
Built-in Joint Test Action Group (JTAG) boundary-scan test
(BST) circuitry compliant with IEEE Std. 1149.1-1990, available
without consuming additional device logic
MultiVolt
TM
I/O interface operation, allowing a device to bridge
between systems operating at different voltages
Low power consumption (typical specification less than 0.5 mA
in standby mode)
3.3-V devices support hot-socketing
Table 1. FLEX 6000 Device Features
Feature
Typical gates
(1)
Logic elements (LEs)
Maximum I/O pins
Supply voltage (V
CCINT
)
Note:
(1)
The embedded IEEE Std. 1149.1 JTAG circuitry adds up to 14,000 gates in addition to the listed typical gates.
EPF6010A
10,000
880
102
3.3 V
EPF6016
16,000
1,320
204
5.0 V
EPF6016A
16,000
1,320
171
3.3 V
EPF6024A
24,000
1,960
218
3.3 V
Altera Corporation
A-DS-F6000-04.1
1

Technical ResourceMore

EEWorld
subscription
account

EEWorld
service
account

Automotive
development
circle

Robot
development
community

Index Files: 1422  2536  2714  1258  2485  29  52  55  26  51 
Datasheet   0 1 2 3 4 5 6 7 8 9 A B C D E F G H I J K L M N O P Q R S T U V W X Y Z
Room 1530, 15th Floor, Building B, No. 18 Zhongguancun Street, Haidian District, Beijing Telephone: (010) 82350740 Postal Code: 100190
Copyright © 2005-2026 EEWORLD.com.cn, Inc. All rights reserved 京ICP证060456号 京ICP备10001474号-1 电信业务审批[2006]字第258号函 京公网安备 11010802033920号