Changes to Burst Read Function Section and Figure 21 ........... 11
Change to Bit 7, Table 44 ............................................................... 19
1/2016—Revision 0: Initial Version
Rev. B | Page 2 of 26
Data Sheet
SPECIFICATIONS
T
A
= 25°C, VDD = 3.3 V, angular rate = 0°/sec, ± 1
g,
MSC_CTRL = 0x00C1, unless otherwise noted.
Table 1.
Parameter
GYROSCOPES
Dynamic Range
Initial Sensitivity
Repeatability
2
Sensitivity Temperature Coefficient
Misalignment
Nonlinearity
Bias Repeatability
2, 3
In-Run Bias Stability
Angle Random Walk
Bias Temperature Coefficient
Linear Acceleration Effect on Bias
Vibration Rectification Error
Bias Supply Sensitivity
Output Noise
Rate Noise Density
−3 dB Bandwidth
Sensor Resonant Frequency
ACCELEROMETERS
Dynamic Range
Initial Sensitivity
Repeatability
2
Sensitivity Temperature Coefficient
Misalignment
Nonlinearity
Bias Repeatability
2, 3
In-Run Bias Stability
Velocity Random Walk
Bias Temperature Coefficient
Vibration Rectification Error
Bias Supply Sensitivity
Output Noise
Noise Density
−3 dB Bandwidth
Sensor Resonant Frequency
TEMPERATURE
Sensitivity
LOGIC INPUTS
5
Input High Voltage, V
IH
Input Low Voltage, V
IL
Logic 1 Input Current, I
IH
Test Conditions/Comments
Min
±100
16-bit data format
32-bit data format
1
0°C ≤ T
A
≤ 70°C
0°C ≤ T
A
≤ 70°C
Axis to axis
Axis to frame (package)
Best fit straight line
0°C ≤ T
A
≤ 70°C, 1 σ
1σ
1 σ, x-axis
1 σ, y-axis, z-axis
0°C ≤ T
A
≤ 70°C
Any axis, 1 σ
20 Hz to 2000 Hz, 5
g
rms
3.15 V ≤ VDD ≤ 3.45 V
No filtering
10 Hz to 40 Hz, no filtering
1
ADIS16460
Typ
Max
Unit
°/sec
°/sec/LSB
°/sec/LSB
%
ppm/°C
Degrees
Degrees
% of FS
°/sec
°/hr
°/√hr
°/√hr
°/sec/°C
°/sec/g
°/sec/g
2
°/sec/V
°/sec rms
°/sec/√Hz rms
Hz
kHz
g
mg/LSB
mg/LSB
%
ppm/°C
Degrees
Degrees
% of FS
mg
mg
m/sec/√hr
mg/°C
mg/g
2
mg/V
mg rms
mg/√Hz rms
Hz
kHz
°C/LSB
V
V
µA
0.005
7.63 × 10
−8
1
±20
±0.05
±1
0.5
0.5
8
0.12
0.17
±0.007
±0.01
±0.0004
0.037
0.075
0.004
375
65
±5
Each axis
16-bit data format
32-bit data format
4
0°C ≤ T
A
≤ 70°C
0°C ≤ T
A
≤ 70°C
Axis to axis
Axis to frame (package)
Best fit straight line
0°C ≤ T
A
≤ +70°C, 1 σ
1σ
1σ
0°C ≤ T
A
≤ 70°C
20 Hz to 2000 Hz, 1
g
rms
3.15 V ≤ VDD ≤ 3.45 V
No filtering
10 Hz to 40 Hz, no filtering
4
0.25
3.81 × 10
−6
1
±15
±0.05
±1
±0.1
±15
0.2
0.09
±0.05
0.08
72
4.5
0.2
350
5.5
0.05
2.0
See Table 37
V
IH
= 3.3 V
±0.2
0.8
±10
Rev. B | Page 3 of 26
ADIS16460
Parameter
Logic 0 Input Current, I
IL
All Pins Except RST
RST Pin
Input Capacitance, C
IN
DIGITAL OUTPUTS
5
Output High Voltage, V
OH
Output Low Voltage, V
OL
FLASH MEMORY
Data Retention
7
FUNCTIONAL TIMES
8
Power-On Start-Up Time
Reset Recovery Time
9, 10
Reset Initiation Time
11
CONVERSION RATE
x_GYRO_OUT, x_ACCL_OUT
Clock Accuracy
Sync Input Clock
12
PPS Input Clock
POWER SUPPLY
Power Supply Current
1
Data Sheet
Test Conditions/Comments
V
IL
= 0 V
Min
Typ
40
1
10
I
SOURCE
= 1.6 mA
I
SINK
= 1.6 mA
Endurance
6
T
J
= 85°C
Time until new data is available
2.4
0.4
10,000
20
290
222
10
2048
MSC_CTRL[3:2] = 01
MSC_CTRL[3:2] = 10
Operating voltage range, VDD
VDD = 3.15 V
0.8
3.15
3.3
44
±3
2000
128
3.45
55
Max
60
Unit
µA
mA
pF
V
V
Cycles
Years
ms
ms
μs
SPS
%
Hz
Hz
V
mA
The X_GYRO_LOW (see Table 10), Y_GYRO_LOW (see Table 12), and Z_GYRO_LOW (see Table 14) registers capture the bit growth associated with the user
configurable filters.
2
The repeatability specifications represent analytical projections, which are based on the following drift contributions and conditions: temperature hysteresis (0°C to
70°C), electronics drift (high temperature operating life test: 85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles, −40°C to
+85°C), rate random walk (10 year projection), and broadband noise.
3
Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density
specifications.
4
The X_ACCL_LOW (see Table 24), Y_ACCL_LOW (see Table 26), and Z_ACCL_LOW (see Table 28) registers capture the bit growth associated with the user configurable
filters.
5
The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
6
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
7
The data retention lifetime equivalent is at a junction temperature (T
J
) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction
temperature.
8
These times do not include thermal settling and internal filter response times (375 Hz bandwidth), which may affect overall accuracy.
9
The parameter assumes that a full start-up sequence has taken place, prior to initiation of the reset cycle.
10
This parameter represents the time between raising the RST line and restoration of pulsing on the DR line, which indicates a return to normal operation.
11
This parameter represents the pulse time on the RST line, which ensures initiation of the reset operation.
12
The sync input clock functions below the specified minimum value but at reduced performance levels.
Rev. B | Page 4 of 26
Data Sheet
TIMING SPECIFICATIONS
T
A
= 25°C, VDD = 3.3 V, unless otherwise noted.
Table 2.
Parameter
f
SCLK
t
STALL
t
READRATE
t
t
DAV
t
DSU
t
DHD
t
SCLKR
, t
SCLKF
t
DR
, t
DF
t
SFS
t
1
t
STDR
t
NV
t
2
CS
ADIS16460
Description
Serial clock
Stall period between data
Read rate
Chip select to SCLK edge
DOUT valid after SCLK edge
DIN setup time before SCLK rising edge
DIN hold time after SCLK rising edge
SCLK rise/fall times
DOUT rise/fall times
CS high after SCLK edge
Input sync positive pulse width
Input sync to data ready valid transition
Data invalid time
Input sync period
Normal Mode
Min
Typ
Max
0.1
2.0
16
24
200
25
25
50
5
12.5
5
12.5
0
25
636
47
500
1
Min
0.1
N/A
2
200
1
Burst Read
Typ
Max
1.0
25
25
50
5
5
0
25
636
47
500
12.5
12.5
Unit
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
µs
µs
µs
µs
1
2
Guaranteed by design and characterization, but not tested in production.
When using the burst read mode, the stall period is not applicable.
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Embedded System
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