If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Above which the useful life may be impared
Storage Temperature (T
STG
)
Maximum Junction Temperature (T
J
)
Ceramic
V
EE
Pin Potential to Ground Pin
Input Voltage (DC)
Output Current (DC Output HIGH)
−65˚C to +150˚C
+175˚C
−7.0V to +0.5V
V
EE
to + 0.5V
−50 mA
ESD (Note 2)
≥2000V
Recommended Operating
Conditions
Case Temperature (T
C
)
Military
Supply Voltage (V
EE
)
−55˚C to +125˚C
−5.7V to −4.2V
Note 1:
Absolute maximum ratings are those values beyond which the de-
vice may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2:
ESD testing conforms to MIL-STD-883, Method 3015.
Military Version
DC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND, T
C
= −55˚C to +125˚C
Symbol
V
OH
Parameter
Output HIGH Voltage
Min
−1025
−1085
V
OL
Output LOW Voltage
Max
−870
−870
Units
mV
mV
mV
mV
mV
mV
−1610
−1555
V
IH
V
IL
I
IL
I
IH
Input HIGH Voltage
Input LOW Voltage
Input LOW Current
Input HIGH Current
−1165
−870
mV
mV
mV
mV
µA
240
340
I
EE
Power Supply Current
−132
−42
mA
µA
µA
T
C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−1830 −1555
V
OHC
Output HIGH Voltage
−1035
−1085
V
OLC
Output LOW Voltage
−55˚C
0˚C to
+125˚C
−55˚C
0˚C to
+125˚C
−55˚C
−55˚C to
+125˚C
−1830 −1475
0.50
−55˚C to
+125˚C
−55˚C to
+125˚C
0˚C to
+125˚C
−55˚C
−55˚C to
+125˚C
Inputs Open
V
EE
= −4.2V to −5.7V
(Notes 3, 4, 5)
V
EE
= −4.2V
V
IN
= V
IL
(Min)
V
EE
= −5.7V
V
IN
= V
IH
(Max)
(Notes 3, 4, 5)
(Notes 3, 4, 5)
Guaranteed LOW Signal for all Inputs
(Notes 3, 4, 5, 6)
Guaranteed HIGH Signal for all Inputs
(Notes 3, 4, 5, 6)
V
IN
= V
IH
(Min)
or V
IL
(Max)
Loading with
50Ω to −2.0V
(Notes 3, 4, 5)
V
IN
= V
IH
(Max)
or V
IL
(Min)
Loading with
50Ω to −2.0V
(Notes 3, 4, 5)
−1830 −1620
Conditions
Notes
Note 3:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
without allowing for the junction temperature to stabilize due to heat dissipation after power-up. This provides “cold start” specs which can be considered a worst case
condition at cold temperatures.
Note 4:
Screen tested 100% on each device at −55˚C, +25˚C, and +125˚C, Subgroups 1, 2, 3, 7, and 8.
Note 5:
Sample tested (Method 5005, Table I) on each manufactured lot at −55˚C, +25˚C, and +125˚C, Subgroups A1, 2, 3, 7, and 8.
Note 6:
Guaranteed by applying specified input condition and testing V
OH
/V
OL
.
AC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND
Symbol
f
max
Parameter
Toggle Frequency
T
C
= −55˚C
Min
400
Max
T
C
= +25˚C
Min
400
Max
T
C
= +125˚C
Min
400
Max
MHz
Units
Conditions
Notes
(Note 10)
Figures 1, 2
3
www.national.com
AC Electrical Characteristics
V
EE
= −4.2V to −5.7V, V
CC
= V
CCA
= GND
Symbol
t
PLH
t
PHL
t
TLH
t
THL
t
s
Parameter
Propagation Delay
CP to Output
Transition Time
20% to 80%, 80% to 20%
Setup Time
D
n
CEN (Disable Time)
CEN (Release Time)
t
h
t
pw
(H)
Hold Time
Pulse Width HIGH
D
n
CP
0.30
0.60
1.40
1.50
2.00
0.40
(Continued)
T
C
= −55˚C
Min
0.70
Max
3.30
2.20
T
C
= +25˚C
Min
0.80
0.40
Max
3.10
2.20
T
C
= +125˚C
Min
0.80
0.40
Max
3.50
2.20
Units
ns
Conditions
Notes
(Notes 7, 8,
9, 11)
(Note 10)
Figures 1, 2
ns
0.30
0.60
1.40
1.50
2.00
0.30
0.60
1.40
1.50
2.00
ns
ns
ns
Figures 1, 3
Figures 1, 4
Figures 1, 2
(Note 10)
(Note 10)
(Note 10)
Note 7:
F100K 300 Series cold temperature testing is performed by temperature soaking (to guarantee junction temperature equals −55˚C), then testing immediately
after power-up. This provides “cold start” specs which can be considered a worst case condition at cold temperatures.
Note 8:
Screen tested 100% on each device at +25˚C temperature only, Subgroup A9.
Note 9:
Sample tested (Method 5005, Table I) on each manufactured lot at +25˚C, Subgroup A9, and at +125˚C and −55˚C, temperatures, Subgroups A10 and A11.
Note 10:
Not tested at +25˚C, +125˚C, and −55˚C temperature (design characterization data).
Note 11:
The propagation delay specified is for single output switching. Delays may vary up to 300 ps with multiple outputs switching.
Test Circuitry
DS100316-6
Notes:
V
CC
, V
CCA
= +2V, V
EE
= −2.5V
L1 and L2 = equal length 50Ω impedance linesR
T
= 50Ω terminator internal to scopeDecoupling 0.1 µF from GND to V
CC
and V
EE
All unused outputs are
loaded with 50Ω to GNDC
L
= Fixture and stray capacitance
≤
3 pF
FIGURE 1. AC, Toggle Frequency Test Circuit
www.national.com
4
Switching Waveforms
DS100316-8
FIGURE 2. Propagation Delay (Clock) and Transition Times
DS100316-9
FIGURE 3. Setup and Pulse Width Times
DS100316-10
Note 12:
t
s
is the minimum time before the transition of the clock that information must be present at the data input.
Note 13:
t
h
is the minimum time after the transition of the clock that information must remain unchanged at the data input.
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