HY62UF16804A Series
512Kx16bit full CMOS SRAM
Document Title
512K x16 bit 3.0V Super Low Power Full CMOS slow SRAM
Revision History
Revision No
04
History
Initial Revision History Insert
Revised
- Reliability Spec Deleted
Change AC Characteristics
- tBLZ : 5/5/5
---> 10/10/10
Part Number is changed
- HY62UF16803A --> HY62UF16804A
Marking Instruction is inserted
Test Condition Changed
- I
LO
/ I
SB
/ I
SB1
/ V
DR
/ I
CCDR
Marking Istruction Inserted
Change Logo
- Hyundai
à
Hynix
Change DC Parameter
- Isb1(LL) : 40uA
à
- Isb1(Typ) : 8uA
à
- Icc
: 5mA
à
- Icc1(1us) : 8mA
à
- Icc1(Min) : 50mA
à
Change Data Retention
- IccDR(LL) : 25uA
à
Change AC Parameter
- tOE
: 35ns
à
: 40ns
à
- tCW
: 50ns
à
- tAW
: 50ns
à
- tBW
: 50ns
à
- tWP
: 45ns
à
- tCHZ
: 30ns
à
- tOHZ
: 30ns
à
- tBHZ
: 30ns
à
25uA
1uA
4mA
4mA
40mA
15uA
25ns@55ns
35ns@70ns
45ns@55ns
45ns@55ns
45ns@55ns
40ns@55ns
20ns@55ns , 30ns
à
25ns@70ns
20ns@55ns , 30ns
à
25ns@70ns
20ns@55ns , 30ns
à
25ns@70ns
Draft Date
Jul.02.2000
Remark
Preliminary
05
Oct.23.2000
Preliminary
06
Nov.13.2000
Preliminary
07
08
Dec.5.2000
Dec.16.2000
Preliminary
Preliminary
09
Apr.28.2001
10
Jan.28.2002
This document is a general product description and is subject to change without notice. Hyundai Electronics does not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev.10 /Jan2002
Hynix Semiconductor
HY62UF16804A
DESCRIPTION
The HY62UF16804A is a high speed, super low
power and 8Mbit full CMOS SRAM organized as
524,288 words by 16bits. The HY62UF16804A
uses high performance full CMOS process
technology and is designed for high speed and
low power circuit technology. It is particularly well-
suited for the high density low power system
application. This device has a data retention
mode that guarantees data to remain valid at a
minimum power supply voltage of 1.2V.
Product
Voltage
Speed
No.
(V)
(ns)
HY62UF16804A-C
2.7~3.3 55/70/85
HY62UF16804A-I
2.7~3.3 55/70/85
Note 1. C : Commercial, I : Industrial
2. Current value is max.
FEATURES
•
Fully static operation and Tri-state output
•
TTL compatible inputs and outputs
•
Battery backup(LL/SL-part)
- 1.2V(min) data retention
•
Standard pin configuration
- 48-uBGA
Operation
Current/Icc(mA)
4
4
Standby Current(uA)
LL
SL
25
8
25
8
Temperature
(°C)
0~70
-40~85
PIN CONNECTION
( Top View )
/LB
/OE A0
A1
A4
A6
A2
NC
A1,A2
A4,A6~A7
A9
A12
A15~A18
A8
BLOCK DIAGRAM
ADD INPUT
BUFFER
COLUMN
DECODER
ROW
DECODER
SENSE AMP
I/O1
IO9 /UB A3
IO10 IO11 A5
/CS IO1
IO2 IO3
IO4 Vcc
I/O8
DATA I/O
BUFFER
ADD INPUT
BUFFER
PRE DECODER
A10
A13
A14
Vss IO12 A17 A7
MEMORY ARRAY
512K x 16
WRITE DRIVER
I/O9
BLOCK
DECODER
Vcc IO13 Vss A16 IO5 Vss
IO15 IO14 A14 A15 IO6 IO7
IO16 NC
A18 A8
A12 A13 /WE IO8
A9
A10 A11 NC
A0
A3
A5
A11
/CS
/OE
/LB
/UB
/WE
ADD INPUT
BUFFER
I/O16
PIN DESCRIPTION
Pin Name
/CS
/WE
/OE
/LB
/UB
Pin Function
Chip Select
Write Enable
Output Enable
Lower Byte Control(I/O1~I/O8)
Upper Byte Control(I/O9~I/O16)
Pin Name
I/O1~I/O16
A0~A18
Vcc
Vss
NC
Pin Function
Data Inputs / Outputs
Address Inputs
Power(2.7V~3.3V)
Ground
No Connection
Rev.10/Jan. 2002
2
HY62UF16804A
ORDERING INFORMATION
Part No.
Speed
HY62UF16804A-DMC
55/70/85
HY62UF16804A-SMC
55/70/85
HY62UF16804A-DMI
55/70/85
HY62UF16804A-SMI
55/70/85
Note 1. C : Commercial, I : Industrial
Power
LL-part
SL-part
LL-part
SL-part
Package
uBGA
uBGA
uBGA
uBGA
Temp.
C
C
I
I
ABSOLUTE MAXIMUM RATINGS (1)
Symbol
V
IN,
V
OUT
Vcc
T
A
T
STG
P
D
T
SOLDER
Parameter
Input/Output Voltage
Power Supply
Operating Temperature
Storage Temperature
Power Dissipation
Ball Soldering Temperature & Time
Rating
-0.3 to Vcc+0.3V
-0.3 to 3.6
0 to 70
-40 to 85
-55 to 150
1.0
260
•
10
Unit
V
V
°C
°C
°C
W
°C •
sec
Remark
HY62UF16804A-C
HY62UF16804A-I
Note
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent
damage to the device. This is stress rating only and the functional operation of the device under these or
any other conditions above those indicated in the operation of this specification is not implied.
Exposure to the absolute maximum rating conditions for extended period may affect reliability.
TRUTH TABLE
/CS
H
X
L
L
L
/WE
X
X
H
H
H
/OE
X
X
H
H
L
/LB
X
H
L
X
L
H
L
L
H
L
/UB
X
H
X
L
H
L
L
H
L
L
Mode
Deselected
Deselected
Output Disabled
Output Disabled
Read
I/O
I/O1~I/O8 I/O9~I/O16
High-Z
High-Z
High-Z
High-Z
High-Z
High-Z
High-Z
High-Z
D
OUT
High-Z
High-Z
D
OUT
D
OUT
D
OUT
D
IN
High-Z
High-Z
D
IN
D
IN
D
IN
Power
Standby
Standby
Active
Active
Active
L
L
X
Write
Active
Note:
1. H=V
IH
, L=V
IL
, X=don't care(V
IH or
V
IL)
2. /UB, /LB(Upper, Lower Byte enable)
These active LOW inputs allow individual bytes to be written or read.
When /LB is LOW, data is written or read to the lower byte, I/O1 -I/O8.
When /UB is LOW, data is written or read to the upper byte, I/O9 -I/O16.
Rev.10/Jan. 2002
2
HY62UF16804A
RECOMMENDED DC OPERATING CONDITION
Symbol
Vcc
Vss
V
IH
V
IL
Parameter
Supply Voltage
Ground
Input High Voltage
Input Low Voltage
Min.
2.7
0
2.2
-0.3
(1)
Typ.
3.0
0
-
-
Max.
3.3
0
Vcc+0.3
0.6
Unit
V
V
V
V
Note : 1. VIL = -1.5V for pulse width less than 30ns
DC ELECTRICAL CHARACTERISTICS
Vcc = 2.7V~3.3V, T
A
= 0°C to 70°C/ -40°C to 85°C
Sym
Parameter
Test Condition
I
LI
Input Leakage Current
Vss < V
IN
< Vcc
Vss < V
OUT
< Vcc, /CS = V
IH
or
I
LO
Output Leakage Current
/
OE
=
V
IH
or /WE = V
IL,
/
UB
=
/LB = V
IH
Operating Power Supply
/CS = V
IL
, V
IN
= V
IH
or V
IL,
I
I/O =
0mA
Icc
Current
Cycle Time=Min,100% duty,
Average Operating
I
I/O =
0mA, /CS = V
IL,
V
IN
= V
IH
or V
IL
Icc1
Current
Cycle time = 1us, 100% duty,
I
I/O =
0mA, /CS < 0.2V, V
IN
<0.2V
/CS = V
IH
or /UB=/LB= V
IH
,
TTL Standby Current
I
SB
(TTL Input)
V
IN
= V
IH
or V
IL
/CS > Vcc - 0.2V or
SL
Standby Current
/UB=/LB > Vcc-0.2V,
I
SB1
(CMOS Input)
V
IN
> Vcc-0.2V or
LL
V
IN
< Vss+0.2V
V
OL
Output Low Voltage
I
OL
= 2.1mA
V
OH
Output High Voltage
I
OH =
-1.0mA
Note : Typical values are at Vcc = 3.0V, T
A
= 25°C
Min.
-1
-1
-
-
-
-
-
-
-
2.4
Typ.
-
-
-
-
-
-
-
1
-
-
Max.
1
1
4
40
4
0.5
8
25
0.4
-
Unit
uA
uA
mA
mA
mA
mA
uA
uA
V
V
CAPACITANCE
(Temp = 25°C, f = 1.0MHz)
Symbol
Parameter
C
IN
Input Capacitance(Add, /CS, /LB, /UB /WE, /OE)
C
OUT
Output Capacitance(I/O)
Note : These parameters are sampled and not 100% tested
Condition
V
IN
= 0V
V
I/O
= 0V
Max.
8
10
Unit
pF
pF
Rev.10/Jan. 2002
3
HY62UF16804A
AC CHARACTERISTICS
Vcc = 2.7V~3.3V, T
A
= 0°C to 70°C/ -40°C to 85°C unless otherwise specified
-55
-70
#
Symbol
Parameter
Max.
Min.
Max. Min.
READ CYCLE
1
tRC
Read Cycle Time
55
-
70
-
2
tAA
Address Access Time
-
55
-
70
3
tACS
Chip Select Access Time
-
55
-
70
4
tOE
Output Enable to Output Valid
-
25
-
35
5
tBA
/LB, /UB Access Time
-
55
-
70
6
tCLZ
Chip Select to Output in Low Z
10
-
10
-
7
tOLZ
Output Enable to Output in Low Z
5
-
5
-
8
tBLZ
/LB, /UB Enable to Output in Low Z
10
-
10
-
9
tCHZ
Chip Deselection to Output in High Z
0
20
0
25
10 tOHZ
Out Disable to Output in High Z
0
20
0
25
11 tBHZ
/LB, /UB Disable to Output in High Z
0
20
0
25
12 tOH
Output Hold from Address Change
10
-
10
-
WRITE CYCLE
13 tWC
Write Cycle Time
55
-
70
-
14 tCW
Chip Selection to End of Write
45
-
60
-
15 tAW
Address Valid to End of Write
45
-
60
-
16 tBW
/LB, /UB Valid to End of Write
45
-
60
-
17 tAS
Address Set-up Time
0
-
0
-
18 tWP
Write Pulse Width
40
-
50
-
19 tWR
Write Recovery Time
0
-
0
-
20 tWHZ
Write to Output in High Z
0
20
0
25
21 tDW
Data to Write Time Overlap
25
-
30
-
22 tDH
Data Hold from Write Time
0
-
0
-
23 tOW
Output Active from End of Write
5
-
5
-
-85
Min
Max.
85
-
-
-
-
10
5
10
0
0
0
10
85
70
70
70
0
55
0
0
35
0
5
-
85
85
45
85
-
-
-
30
30
30
-
-
-
-
-
-
-
-
30
-
-
-
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
AC TEST CONDITIONS
T
A
= 0°C to 70°C / -40°C to 85°C, unless otherwise specified
PARAMETER
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Level
tCLZ,tOLZ,tBLZ,tCHZ,tOHZ,tBHZ,tWHZ,tOW
Output Load
Other
Value
0.4V to 2.2V
5ns
1.5V
CL = 5pF + 1TTL Load
CL = 30pF + 1TTL Load
AC TEST LOADS
V
TM
= 2.8V
1029 Ohm
D
OUT
CL(1)
1728 Ohm
Note
1. Including jig and scope capacitance
Rev.10/Jan. 2002
4
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