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UD61256DC08

Description
Fast Page DRAM, 256KX1, 80ns, CMOS, PDIP16, 0.300 INCH, PLASTIC, DIP-16
Categorystorage    storage   
File Size146KB,13 Pages
ManufacturerZentrum Mikroelektronik Dresden AG (IDT)
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UD61256DC08 Overview

Fast Page DRAM, 256KX1, 80ns, CMOS, PDIP16, 0.300 INCH, PLASTIC, DIP-16

UD61256DC08 Parametric

Parameter NameAttribute value
MakerZentrum Mikroelektronik Dresden AG (IDT)
Parts packaging codeDIP
package instructionDIP, DIP16,.3
Contacts16
Reach Compliance Codecompliant
ECCN codeEAR99
access modeFAST PAGE
Maximum access time80 ns
I/O typeSEPARATE
JESD-30 codeR-PDIP-T16
length19.44 mm
memory density262144 bit
Memory IC TypeFAST PAGE DRAM
memory width1
Number of functions1
Number of ports1
Number of terminals16
word count262144 words
character code256000
Operating modeASYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize256KX1
Output characteristics3-STATE
Package body materialPLASTIC/EPOXY
encapsulated codeDIP
Encapsulate equivalent codeDIP16,.3
Package shapeRECTANGULAR
Package formIN-LINE
power supply5 V
Certification statusNot Qualified
refresh cycle256
Maximum seat height5.1 mm
Maximum slew rate0.06 mA
Maximum supply voltage (Vsup)5.5 V
Minimum supply voltage (Vsup)4.5 V
Nominal supply voltage (Vsup)5 V
surface mountNO
technologyCMOS
Temperature levelCOMMERCIAL
Terminal formTHROUGH-HOLE
Terminal pitch2.54 mm
Terminal locationDUAL
width7.62 mm

UD61256DC08 Preview

Maintenance only
Features
Description
Addressing
The UD61256 is a dynamic Write-
Read-memory with random access.
FPM facilitates faster data operation
with predefined row address. Via 9
address inputs the 18 address bits
are transmitted into the internal
address memories in a time-multi-
plex operation. The falling RAS-
edge takes over the row address.
During RAS Low, the column
address together with the CAS
signal are taken over. The selection
of one or more memory circuits can
be made by activation of the RAS
input.
Read-Write-Control
The choice between Read or Write
cycle is made at the W input. HIGH
at the W input causes a Read cycle,
meanwhile LOW leads to a Write
cycle.
Both CAS-controlled and W-control-
led Write cycles are possible with
activated RAS signal.
UD61256
256K x 1 DRAM
Data Output Control
The usual state of the data output is
the High-Z state. Whenever CAS is
inactive (HIGH), Q will float (High-Z).
Thus, CAS functions as data output
control.
After access time, in case of a Read
cycle, the output is activated, and it
contains the logic „0“ or „1“.
Q is then valid until CAS returns into
to inactive state (HIGH).
The memory cycle being a Read,
Read-Write or a Write cycle (W-con-
trolled), Q changes from High-Z
state to the active state („0“ or „1“).
After the access time the contents of
the selected cell is available, except
for the Write cycle.
The output remains active until CAS
becomes inactive, irrespective of
RAS becoming inactive or not. The
memory cycle being a Write cycle
(CAS-controlled), the data output
keeps its High-Z state throughout
the whole cycle. This configuration
makes Q fully controllable by the
user merely through the timing of W.
The output storaging the data, they
remain valid from the end of access
time until the start of another cycle.
F
Dynamic random access memory
F
F
F
F
F
F
F
F
F
F
262144 x 1 bit manufactured
using a CMOS technology
RAS access times 70 ns, 80 ns
TTL-compatible
Three-state output
256 refresh cycles
4 ms refresh cycle time
FAST PAGE MODE
Operating modes: Read, Write,
Read - Write,
RAS only Refresh,
Hidden Refresh with address
transfer
Power Supply Voltage 5 V
Packages PDIP16 (300 mil)
SOJ20/26 (300 mil)
Operating temperature range
0 to 70 °C
Quality assessment according to
CECC 90000, CECC 90100 and
CECC 90112
Pin Configuration
Pin Description
A8
D
W
RAS
n.c.
1
2
3
4
5
26
25
24
23
22
V
CAS
Q
Signal Name
A8
D
W
1
2
3
4
5
6
7
8
16
15
14
VSS
CAS
Q
A6
A3
A4
A5
A7
A0 - A8
D
W
RAS
UCC
USS
CAS
Q
n.c.
Signal Description
Address Inputs
Data Input
Read, Write Control
Row Address Strobe
Power Supply Voltage
Ground
Column Address Strobe
Data Output
no connected
A6
n.c.
RAS
A0
A2
PDIP
13
12
11
10
9
SOJ
A1
VCC
18
17
16
15
14
n.c.
A3
A4
A5
A7
n.c.
A0
A2
A1
VCC
9
10
11
12
13
Top View
Top View
December 12, 1997
1
UD61256
Block Diagram
CAS
Output Control
Decoder
1 out of 4
Data Output
Amplifier
4 Write-Read
Amplifier
Data
W
Write-Read Control
Q
D
Data Input Amplifier
RAS
Clock Generator
128 Kbit Array with
Sensor Amplifier
128 Kbit Array with
Sensor Amplifier
Row
Decoder
V
CC
V
SS
Column Decoder
A0
A1
A2
Address Input
A3
A4
A5
A6
A7
A8
M
U
X
A8X
A8Y
Row
Decoder
A0X to A7X
A0Y to A7Y
Operation
Address
Function
Stand-by
Read
Write
Read-Write
1st
cycle
2nd
cycle
1st
cycle
2nd
cycle
1st
cycle
2nd
cycle
RAS
H
L
L
L
L
L
L
L
L
L
L
Read L
H
L
Write L
H
L
*) Transfer of Refresh Address required
Data
C
X
D
X
X
Input Data
Input Data
X
X
Input Data
Input Data
Input Data
Input Data
X
Q
High-Z
Output
Data
High-Z
Output
Data
Output
Data
Output
Data
High-Z
High-Z
Output
Data
Output
Data
High-Z
Output
Data
High-Z
CAS
X
L
L
L
H
L
H
L
H
L
H
L
H
L
H
L
H
L
L
W
R
X
H
L
H
L
H
H
L
L
H
L
H
L
X
H
L
2
Row
Row
Row
Column
Column
Row
Row
X
Row
Row
Row
Row
Column
Column
Column
Column
Column
Column
Column
Column
Column
FPM
Read
FPM
Write
FPM
Read-Write
RAS only Refresh
HIDDEN Refresh*)
X
Input Data
December 12, 1997
UD61256
Characteristics
All voltages are referenced to V
SS
= 0 V (ground).
All characteristics are valid in the power supply voltage range and operating temperature range indicated below.
Absolute Maximum Ratings
Power Supply Voltage
Input Voltage
Output Voltage
Output Current
Power Dissipation
Operating Temperature
Storage Temperature
Remarks: see page 7
1)
1)
Symbol
V
CC
V
I
V
O
I
O
P
D
T
a
T
stg
Min.
-0.5
-1.0
-1.0
-50
Max.
7.0
7.0
7.0
50
1
Unit
V
V
V
mA
W
°C
°C
0
-55
70
125
Recommended Operating Conditions
Power Supply Voltage
Input Low Voltage
Input High Voltage
Remark: see page 7
1)
Symbol
V
CC
V
IL
V
IH
Min.
4.5
-1.0
2.4
Max.
5.5
0.8
5.5
Unit
V
V
V
Capacitances
Input Capacitance
A0 to A8, D
Input Capacitance
RAS, CAS, W
Output Capacitance
Conditions
Symbol
C
I1
C
I2
C
O
Min.
Max.
6
7
7
Unit
pF
pF
pF
V
CC
V
I
f
T
a
= 5.0 V
= V
SS
= 1 MHz
= 25
°C
All pins not under test must be connected with ground by capacitors.
December 12, 1997
3
UD61256
Static Characteristics
Min.
Conditions
Symbol
07
Power Supply Current
(average value of RAS-CAS cycles)
Refresh Current
(average value of RAS cycles)
FPM Current
(average value of FPM cycles)
Stand-by Current (TTL Level)
2)
Max.
Unit
08
07
70
08
60
mA
t
cW
= t
cWmin
t
cR
= t
cRmin
t
cW
= t
cWmin
t
cR
= t
cRmin
CAS = V
IH
t
cPG
= t
cPGmin
RAS = V
IL
RAS = CAS
= V
IH
RAS = CAS
= V
CC
- 0.2 V
I
OH
= -5 mA
I
OL
= 4.2 mA
V
I
= 0 V to
5.5 V
V
O
= 0 V to
5.5 V
RAS = CAS
= V
IH
I
CC1
2)
I
CC2
70
60
mA
2)
I
CC3
50
40
mA
I
CC4
2
2
mA
Stand-by Current (CMOS Level)
I
CC5
1
1
mA
Output High Voltage
Output Low Voltage
Input Leakage Current
at any input,
all other pins = 0 V
Output Leakage Current
Q = High-Z
V
OH
V
OL
I
I
2.4
2.4
0.4
0.4
10
V
V
µA
-10
-10
10
I
O
-10
-10
10
10
µA
Remarks: see page 7
4
December 12, 1997
UD61256
Symbol
Dynamic Characteristics
3)
Min.
07
08
07
Max.
Unit
08
Alt.
IEC
F
ALL CYCLES
Transition Time (Rise and Fall)
RAS Precharge Time
CAS Precharge Time
Row Address Set-up Time
Column Address Set-up Time
Row Address Hold Time
Column Address Hold Time
Column Address Hold Time ref. to RAS
Output Buffer Turn-off Delay
CAS to RAS Precharge Time
RAS to Column Address Delay Time
Column Address to RAS Lead Time
CAS to Output in Low-Z
Refresh Period
5)
4)
t
T
t
RP
t
CP
t
ASR
t
ASC
t
RAH
t
t
3
50
10
0
0
10
15
55
0
5
15
35
0
3
60
10
0
0
10
15
60
0
5
15
40
0
50
50
ns
ns
ns
ns
ns
ns
ns
ns
t
w(RASH)
t
w(CASH)
t
su(RA-RAS)
t
su(CA-CAS)
t
h(RAS-RA)
t
h(CAS-CA)
t
h(RAS-CA)
t
v(CAS)
t
CASH-RASL
t
RAS-CA
t
CA-RASH
t
CASL-QX
t
rf
t
CAH
t
AR
t
OFF
t
CRP
t
RAD
t
RAL
t
CLZ
t
REF
20
35
20
40
ns
ns
ns
ns
ns
ms
6)
4
4
F
READ
Random Read Cycle Time
Access Time from RAS
Access Time from Column Address
Access Time from CAS
RAS Pulse Width
CAS Pulse Width
Read Command Set-up Time
Read Command Hold Time ref. to RAS
Read Command Hold Time
RAS to CAS Delay Time
CAS Hold Time
RAS Hold Time
9)
9)
6)
12)
7), 8)
7), 8)
7), 8)
t
RC
t
RAC
t
AA
t
CAC
t
RAS
t
CAS
t
RCS
t
RRH
t
RCH
t
RCD
t
CSH
t
RSH
t
cR
t
a(RAS)
t
a(CA)
t
a(CAS)
t
w(RASL)
t
w(CASL)
t
su(R-CAS)
t
h(RAS-R)
t
h(CAS-R)
t
RASL-CASL
t
RASL-CASH
t
CASL-RASH
130
150
70
35
20
80
40
20
10000
10000
ns
ns
ns
ns
ns
ns
ns
ns
ns
50
60
ns
ns
ns
70
20
0
0
0
20
70
20
80
20
0
0
0
20
80
20
10000
10000
F
WRITE
Random Write Cycle Time
RAS Pulse Width
CAS Pulse Width
Write Command Pulse Width
Remarks: see page 7
12)
t
RC
t
RAS
t
CAS
t
WP
t
cW
t
w(RASL)
t
w(CASL)
t
w(W)
130
70
20
15
150
80
20
15
10000
10000
10000
10000
ns
ns
ns
ns
December 12, 1997
5

UD61256DC08 Related Products

UD61256DC08 UD61256DC07 UD61256JC08 UD61256JC07
Description Fast Page DRAM, 256KX1, 80ns, CMOS, PDIP16, 0.300 INCH, PLASTIC, DIP-16 Fast Page DRAM, 256KX1, 70ns, CMOS, PDIP16, 0.300 INCH, PLASTIC, DIP-16 Fast Page DRAM, 256KX1, 80ns, CMOS, PDSO20, 0.300 INCH, SOJ-26/20 Fast Page DRAM, 256KX1, 70ns, CMOS, PDSO20, 0.300 INCH, SOJ-26/20
Maker Zentrum Mikroelektronik Dresden AG (IDT) Zentrum Mikroelektronik Dresden AG (IDT) Zentrum Mikroelektronik Dresden AG (IDT) Zentrum Mikroelektronik Dresden AG (IDT)
Parts packaging code DIP DIP SOJ SOJ
package instruction DIP, DIP16,.3 DIP, DIP16,.3 SOJ, SOJ20/26,.34 SOJ, SOJ20/26,.34
Contacts 16 16 20 20
Reach Compliance Code compliant compliant compliant compli
ECCN code EAR99 EAR99 EAR99 EAR99
access mode FAST PAGE FAST PAGE FAST PAGE FAST PAGE
Maximum access time 80 ns 70 ns 80 ns 70 ns
I/O type SEPARATE SEPARATE SEPARATE SEPARATE
JESD-30 code R-PDIP-T16 R-PDIP-T16 R-PDSO-J20 R-PDSO-J20
length 19.44 mm 19.44 mm 17.15 mm 17.15 mm
memory density 262144 bit 262144 bit 262144 bit 262144 bi
Memory IC Type FAST PAGE DRAM FAST PAGE DRAM FAST PAGE DRAM FAST PAGE DRAM
memory width 1 1 1 1
Number of functions 1 1 1 1
Number of ports 1 1 1 1
Number of terminals 16 16 20 20
word count 262144 words 262144 words 262144 words 262144 words
character code 256000 256000 256000 256000
Operating mode ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS ASYNCHRONOUS
Maximum operating temperature 70 °C 70 °C 70 °C 70 °C
organize 256KX1 256KX1 256KX1 256KX1
Output characteristics 3-STATE 3-STATE 3-STATE 3-STATE
Package body material PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY
encapsulated code DIP DIP SOJ SOJ
Encapsulate equivalent code DIP16,.3 DIP16,.3 SOJ20/26,.34 SOJ20/26,.34
Package shape RECTANGULAR RECTANGULAR RECTANGULAR RECTANGULAR
Package form IN-LINE IN-LINE SMALL OUTLINE SMALL OUTLINE
power supply 5 V 5 V 5 V 5 V
Certification status Not Qualified Not Qualified Not Qualified Not Qualified
refresh cycle 256 256 256 256
Maximum seat height 5.1 mm 5.1 mm 3.76 mm 3.76 mm
Maximum slew rate 0.06 mA 0.07 mA 0.06 mA 0.07 mA
Maximum supply voltage (Vsup) 5.5 V 5.5 V 5.5 V 5.5 V
Minimum supply voltage (Vsup) 4.5 V 4.5 V 4.5 V 4.5 V
Nominal supply voltage (Vsup) 5 V 5 V 5 V 5 V
surface mount NO NO YES YES
technology CMOS CMOS CMOS CMOS
Temperature level COMMERCIAL COMMERCIAL COMMERCIAL COMMERCIAL
Terminal form THROUGH-HOLE THROUGH-HOLE J BEND J BEND
Terminal pitch 2.54 mm 2.54 mm 1.27 mm 1.27 mm
Terminal location DUAL DUAL DUAL DUAL
width 7.62 mm 7.62 mm 7.65 mm 7.65 mm
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