TLP620(D4)SERIES,TLP621(D4)SERIES,TLP750(D4)SERIES
TOSHIBA Photocoupler
TLP620(D4)SERIES,TLP621(D4)SERIES,TLP750(D4)SERIES
Attachment: Specifications for VDE0884 option: (D4)
Types: TLP620, TLP620-2, TLP620-4, TLP621, TLP621-2, TLP621-4, TLP750, TLP751
Type designations for ‘ option : (D4) ’, which are tested under VDE0884 requirements.
Ex. : TLP621 (D4-GR-LF2)
D4: VDE0884 option
GR: CTR rank
LF2: Standard lead bend
Note: Use TOSHIBA standard type number for safety standard application.
Ex. TLP621 (D4-GR-LF2)
→
TLP621
VDE0884 Isolation Characteristics
Description
Application classification
(DIN VDE0109 / 12.83, table 1)
for rated mains voltage
≤
300 V
rms
for rated mains voltage
≤
600 V
rms
Climatic classification
(DIN IEC68 teil 1 / 09.80)
Pollution degree (DIN VDE0109 / 12.83)
Maximum operating insulation voltage
Input to output test voltage, method A
Vpr = 1.5×V
IORM
, type and sample test
t
P
= 60s, partial discharge < 5pC
Input to output test voltage, method
Ｂ
Vpr = 1.875×V
IORM
, 100% production test
t
P
= 1s, partial discharge < 5pC
Highest permissible overvoltage
(transient overvoltage, t
pr
= 10s)
Safety limiting values (max. permissible ratings in
case of fault, also refer to thermal derating curve)
current (input current I
F
, P
si
= 0)
power (output or total power dissipation)
temperature
Insulation resistance at Tsi, V
IO
= 500V
V
IORM
Vpr
Symbol
Rating
Unit
I-IV
I-III
55 / 100 / 21
2
890
1335
―
―
―
Vpk
Vpk
Vpr
1670
Vpk
V
TR
8000
Vpk
I
si
P
si
T
si
R
si
300
500
150
≥10
9
mA
mW
°C
Ω
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2002-09-25
TLP620(D4)SERIES,TLP621(D4)SERIES,TLP750(D4)SERIES
Insulation Related Specifications
Minimum creepage distance
Minimum clearance
Minimum insulation thickness
Comperative tracking index
(DIN IEC112 / VDE0303, part 1)
(*)
(*)
Cr
Cl
ti
CTI
7. 0 mm
7. 0 mm
0.5 mm
175
(VDE0109 / 12.83 group III a)
((*) in accordance with DIN VDE0109 / 12.83, table 2, & 4)
(*1)
If a printed circuit is incorporated, the creepage distance and clearance may be reduced below this
value (e. g. at a standard distance between soldering eye centres of 7.5 mm). If this is not permissible,
the user shall take suitable measures.
This photocoupler is suitable for ‘safe electrical isolation’ only within the safety limit data.
Maintenance of the safety data shall be ensured by means of protective circuits.
(*2)
TLP620, 620-2, 620-4
TLP621, 621-2, 621-4
VDE test sign: Marking on product
for VDE0884
4
TLP750, 751
D
V
E
Marking on packing
for VDE0884
D
V
E
0884
D
V
E
0884
Marking example: 4 pin type
Others
or
Lot No.
P
Type name without “TL”
CTR or I
FT rank marking
Mark for option (D4)
1 pin indication
TLP
or
Lot No.
Type name
CTR or I
FT rank marking
Mark for option (D4)
1 pin indication
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2002-09-25
TLP620(D4)SERIES,TLP621(D4)SERIES,TLP750(D4)SERIES
Figure 1
Partial discharge measurement procedure according to VDE0884
Destructive test for qualification and sampling tests.
Method A
V
V
INITIAL
(6kV)
V
pr
(1335V)
V
IORM
(890V)
(for type and sampling tests,
destructive tests)
t
1
,t
2 = 1
to 10s
t
3
,t
4 = 1s
t
P
(measuring time for
partial discharge) = 50s
t
b = 62s
t
ini = 10s
0
t
1
t
ini
t
3
t
2
t
P
t
b
t
4
t
Figure 2
Partial discharge measurement procedure according to VDE0884
Non-destructive test for 100% inspection.
V
V
pr
(1kV)
V
IORM
(890V)
Method B
(for sample test, non-
destructive test)
t
3
,t
4 = 0.1s
tP(measuring time for
partial discharge) = 1s
t
b
= 1.2s
t
P
t
3
t
b
t
4
t
Figure 3
Dependency of maximum safety ratings on ambient temperature
I
si
(mA)
500
400
300
200
100
→
P
si
0
0
25
50
75
100
Ta (°C)
125
150
1000
800
600
400
200
0
175
P
si
(mW)
I
si
←
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2002-09-25
TLP620(D4)SERIES,TLP621(D4)SERIES,TLP750(D4)SERIES
RESTRICTIONS ON PRODUCT USE
000707EBC
·
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
·
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
·
Gallium arsenide (GaAs) is a substance used in the products described in this document. GaAs dust and fumes
are toxic. Do not break, cut or pulverize the product, or use chemicals to dissolve them. When disposing of the
products, follow the appropriate regulations. Do not dispose of the products with other industrial waste or with
domestic garbage.
·
The products described in this document are subject to the foreign exchange and foreign trade laws.
·
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
·
The information contained herein is subject to change without notice.
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2002-09-25
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