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UPD4481321F9-C65-EQX

Description
ZBT SRAM, 256KX32, 6.5ns, CMOS, PBGA165, 13 X 15 MM, FBGA-165
Categorystorage    storage   
File Size222KB,40 Pages
ManufacturerNEC Electronics
Download Datasheet Parametric View All

UPD4481321F9-C65-EQX Overview

ZBT SRAM, 256KX32, 6.5ns, CMOS, PBGA165, 13 X 15 MM, FBGA-165

UPD4481321F9-C65-EQX Parametric

Parameter NameAttribute value
MakerNEC Electronics
Parts packaging codeBGA
package instructionBGA,
Contacts165
Reach Compliance Codeunknown
ECCN code3A991.B.2.A
Maximum access time6.5 ns
JESD-30 codeR-PBGA-B165
length15 mm
memory density8388608 bit
Memory IC TypeZBT SRAM
memory width32
Number of functions1
Number of terminals165
word count262144 words
character code256000
Operating modeSYNCHRONOUS
Maximum operating temperature70 °C
Minimum operating temperature
organize256KX32
Package body materialPLASTIC/EPOXY
encapsulated codeBGA
Package shapeRECTANGULAR
Package formGRID ARRAY
Parallel/SerialPARALLEL
Certification statusNot Qualified
Maximum supply voltage (Vsup)2.625 V
Minimum supply voltage (Vsup)2.375 V
Nominal supply voltage (Vsup)2.5 V
surface mountYES
technologyCMOS
Temperature levelCOMMERCIAL
Terminal formBALL
Terminal pitch1 mm
Terminal locationBOTTOM
width13 mm
PRELIMINARY DATA SHEET
MOS INTEGRATED CIRCUIT
µ
PD4481161, 4481181, 4481321, 4481361
8M-BIT ZEROSB
TM
SRAM
FLOW THROUGH OPERATION
Description
The
µ
PD4481161 is a 524,288-word by 16-bit, the
µ
PD4481181 is a 524,288-word by 18-bit, the
µ
PD4481321 is a
262,144-word by 32-bit and the
µ
PD4481361 is a 262,144-word by 36-bit ZEROSB static RAM fabricated with
advanced CMOS technology using full CMOS six-transistor memory cell.
The
µ
PD4481161,
µ
PD4481181,
µ
PD4481321 and
µ
PD4481361 are optimized to eliminate dead cycles for read to
write, or write to read transitions. These ZEROSB static RAMs integrate unique synchronous peripheral circuitry, 2-bit
burst counter and output buffer as well as SRAM core. All input registers are controlled by a positive edge of the
single clock input (CLK).
The
µ
PD4481161,
µ
PD4481181,
µ
PD4481321 and
µ
PD4481361 are suitable for applications which require
synchronous operation, high speed, low voltage, high density and wide bit configuration, such as buffer memory.
ZZ has to be set LOW at the normal operation. When ZZ is set HIGH, the SRAM enters Power Down State
(“Sleep”). In the “Sleep” state, the SRAM internal state is preserved. When ZZ is set LOW again, the SRAM resumes
normal operation.
The
µ
PD4481161,
µ
PD4481181,
µ
PD4481321 and
µ
PD4481361 are packaged in 100-pin PLASTIC LQFP with a
1.4 mm package thickness or 165-pin TAPE FBGA for high density and low capacitive loading.
Features
Low voltage core supply (A version : V
DD
= 3.3 ± 0.165V, C version : V
DD
= 2.5 ± 0.125V)
Synchronous operation
100 percent bus utilization
Internally self-timed write control
Burst read / write : Interleaved burst and linear burst sequence
Fully registered inputs and outputs for pipelined operation
All registers triggered off positive clock edge
3.3V or 2.5V LVTTL Compatible : All inputs and outputs
Fast clock access time : 6.5 ns (133 MHz), 7.5 ns (117 MHz), 8.5 ns (100 MHz)
Asynchronous output enable : /G
Burst sequence selectable : MODE
Sleep mode : ZZ (ZZ = Open or Low : Normal operation)
Separate byte write enable : /BW1 - /BW4 (
µ
PD4481321 and
µ
PD4481361), /BW1 - /BW2 (
µ
PD4481181 and
µ
PD4481181)
Three chip enables for easy depth expansion
Common I/O using three state outputs
The information in this document is subject to change without notice. Before using this document, please
confirm that this is the latest version.
Not all devices/types available in every country. Please check with local NEC representative for
availability and additional information.
Document No. M15561EJ1V0DS00 (1st edition)
Date Published June 2001 NS CP(K)
Printed in Japan
©
2001
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