C0G (NP0) Dielectric
General Specifications
C0G (NP0) is the most popular formulation of the “temperature-compensating,” EIA Class I ceramic materials.
Modern C0G (NP0) formulations contain neodymium, samarium and other rare earth oxides.
C0G (NP0) ceramics offer one of the most stable capacitor dielectrics available. Capacitance change with
temperature is 0 ±30ppm/°C which is less than ±0.3% C from -55°C to +125°C. Capacitance drift or hysteresis
for C0G (NP0) ceramics is negligible at less than ±0.05% versus up to ±2% for films. Typical capacitance
change with life is less than ±0.1% for C0G (NP0), one-fifth that shown by most other dielectrics. C0G (NP0)
formulations show no aging characteristics.
PART NUMBER (SEE PAGE 4 FOR COMPLETE PART NUMBER EXPLANATION)
0805
Size
(L” x W”)
5
Voltage
6.3V = 6
10V = Z
16V = Y
25V = 3
50V = 5
100V = 1
200V = 2
250V = V
500V = 7
A
Dielectric
C0G (NP0) = A
101
Capacitance
Code (In pF)
2 Sig. Digits +
Number of Zeros
J
Capacitance
Tolerance
B = ±.10 pF (<10pF)
C = ±.25 pF (<10pF)
D = ±.50 pF (<10pF)
F = ±1% (≥ 10 pF)
G = ±2% (≥ 10 pF)
J = ±5%
K = ±10%
A
Failure
Rate
A = Not
Applicable
T
Terminations
T = Plated Ni
and Sn
Contact
Factory For
1 = Pd/Ag Term
7 = Gold Plated
NOT RoHS
COMPLIANT
2
Packaging
2 = 7” Reel
4 = 13” Reel
U = 4mm TR
(01005)
A
Special
Code
A = Std.
Product
Contact Factory
For Multiples
NOTE: Contact factory for availability of Termination and Tolerance Options for Specific Part
Numbers. Contact factory for non-specified capacitance values.
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
022620
3
–
surface mount ceramic capacitor products
–
C0G (NP0) Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Q
Insulation Resistance
NP0 Specification Limits
-55ºC to +125ºC
Within specified tolerance
<30 pF: Q≥ 400+20 x Cap Value
≥30 pF: Q≥ 1000
100,000MΩ or 1000MΩ - µF,
whichever is less
No breakdown or visual defects
No defects
±5% or ±.5 pF, whichever is greater
Meets Initial Values (As Above)
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
≤ ±2.5% or ±.25 pF, whichever is greater
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±2.5% or ±.25 pF, whichever is greater
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±3.0% or ± .3 pF, whichever is greater
≥ 30 pF:
≥10 pF, <30 pF:
<10 pF:
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
Dip device in eutectic solder at 260ºC for
60sec- onds. Store at room temperature
for 24 ± 2hours before measuring electrical
properties.
Dip device in eutectic solder at 230 ± 5ºC for 5.0 ±
0.5 seconds
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
1.0 kHz ± 10% for cap > 1000 pF
Voltage: 1.0Vrms ± .2V
Charge device with rated voltage for 60 ± 5 secs
@ room temp/humidity
Charge device with 250% of rated voltage for 1-5
seconds, w/charge and discharge current limited
to 50 mA (max)
Note: Charge device with 150% of rated voltage
for 500V devices.
Deflection: 2mm
Test Time: 30 seconds
Dielectric Strength
Appearance
Resistance to
Flexure
Stresses
Capacitance
Variation
Q
Insulation
Resistance
Solderability
Appearance
Capacitance
Variation
Resistance to
Solder Heat
Q
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Thermal Shock
Q
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Load Life
Q
(C=Nominal Cap)
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Load
Humidity
Q
Insulation
Resistance
Dielectric
Strength
Repeat for 5 cycles and measure after
24 hours at room temperature
Charge device with twice rated voltage in test
chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0).
Remove from test chamber and stabilize at
room temperature for 24 hours
before measuring.
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±5.0% or ± .5 pF, whichever is greater
≥ 30 pF:
≥10 pF, <30 pF:
<10 pF:
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
Store in a test chamber set at 85ºC ± 2ºC/ 85% ±
5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at room
temperature for 24 ± 2 hours before measuring.
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
4
The Important Information/Disclaimer is incorporated in the catalog where these specifications came from or available
online at www.kyocera-avx.com/disclaimer/ by reference and should be reviewed in full before placing any order.
051818
–
surface mount ceramic capacitor products
–
Microcontroller MCU
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