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SSM6K210FE

Description
TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type
CategoryDiscrete semiconductor    The transistor   
File Size239KB,6 Pages
ManufacturerToshiba Semiconductor
Websitehttp://toshiba-semicon-storage.com/
Download Datasheet Parametric View All

SSM6K210FE Overview

TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type

SSM6K210FE Parametric

Parameter NameAttribute value
MakerToshiba Semiconductor
package instructionSMALL OUTLINE, R-PDSO-F6
Contacts6
Reach Compliance Codeunknow
ECCN codeEAR99
ConfigurationSINGLE WITH BUILT-IN DIODE
Minimum drain-source breakdown voltage30 V
Maximum drain current (ID)1.4 A
Maximum drain-source on-resistance0.371 Ω
FET technologyMETAL-OXIDE SEMICONDUCTOR
JESD-30 codeR-PDSO-F6
Number of components1
Number of terminals6
Operating modeENHANCEMENT MODE
Package body materialPLASTIC/EPOXY
Package shapeRECTANGULAR
Package formSMALL OUTLINE
Polarity/channel typeN-CHANNEL
Certification statusNot Qualified
surface mountYES
Terminal formFLAT
Terminal locationDUAL
transistor applicationsSWITCHING
Transistor component materialsSILICON
SSM6K210FE
TOSHIBA Field-Effect Transistor Silicon N-Channel MOS Type
SSM6K210FE
High-Speed Switching Applications
Power Management Switch Applications
4.0-V drive
Low ON-resistance: R
on
= 371 mΩ (max) (@V
GS
= 4.0 V),
R
on
= 228 mΩ (max) (@V
GS
= 10 V)
Unit: mm
Absolute Maximum Ratings (Ta = 25˚C)
Characteristics
Drain-source voltage
Gate-source voltage
Drain current
Drain power dissipation
Channel temperature
Storage temperature
DC
Pulse
Symbol
V
DSS
V
GSS
I
D
I
DP
P
D
(Note1)
T
ch
T
stg
Rating
30
±20
1.4
2.8
500
150
−55
to 150
Unit
V
V
A
mW
°C
°C
1.2.5.6
3.
4.
: Drain
: Gate
: Source
ES6
JEDEC
Note:
JEITA
Using continuously under heavy loads (e.g. the application of
high temperature/current/voltage and the significant change in
TOSHIBA
2-2N1A
temperature, etc.) may cause this product to decrease in the
Weight: 3 mg (typ.)
reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the
absolute maximum ratings.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Note 1: Mounted on an FR4 board
2
(25.4 mm
×
25.4 mm
×
1.6 mm, Cu Pad: 645 mm )
Marking
6
5
4
Equivalent Circuit
(top view)
6
5
4
NP
1
2
3
1
2
3
Start of commercial production
2008-04
1
2014-03-01

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