CAUTION: Do not operate at or near the maximum ratings listed for extended periods of time. Exposure to such conditions may adversely impact product reliability and
result in failures not covered by warranty.
NOTE:
1.
θ
JA
is measured with the component mounted on a high effective thermal conductivity test board in free air. See Tech Brief TB379 for details.
Electrical Specifications
All specifications apply under the following conditions unless otherwise noted: AVDD = 1.8V, OVDD = 1.8V,
T
A
= -40°C to +85°C (typical specifications at +25°C), A
IN
= -1dBFS, f
SAMPLE
= 500MSPS.
KAD5512P-50
(Note 2)
PARAMETER
DC SPECIFICATIONS
Analog Input
Full-Scale Analog Input Range
Input Resistance
Input Capacitance
Full Scale Range Temp. Drift
Input Offset Voltage
Gain Error
Common-Mode Output Voltage
Clock Inputs
Inputs Common Mode Voltage
CLKP,CLKN Input Swing
Power Requirements
1.8V Analog Supply Voltage
1.8V Digital Supply Voltage
1.8V Analog Supply Current
1.8V Digital Supply Current (Note 3)
Power Supply Rejection Ratio
Total Power Dissipation
Normal Mode
Nap Mode
Sleep Mode
Nap Mode Wakeup Time (Note 4)
Sleep Mode Wakeup Time (Note 4)
AC SPECIFICATIONS (Notes 5, 6)
Differential Nonlinearity
Integral Nonlinearity
Minimum Conversion Rate (Note 7)
Maximum Conversion Rate
DNL
INL
f
S
MIN
f
S
MAX
500
-0.8
-2.0
±0.3
±0.8
0.8
2.0
80
LSB
LSB
MSPS
MSPS
P
D
P
D
P
D
CSB at logic high
Sample Clock Running
Sample Clock Running
3mA LVDS
432
148
2
1
1
460
163
6
mW
mW
mW
µs
ms
AVDD
OVDD
IAVDD
I
OVDD
PSRR
3mA LVDS
30MHz, 200mV
P-P
1.7
1.7
1.8
1.8
171
68
-36
1.9
1.9
178
76
V
V
mA
mA
dB
0.9
1.8
V
V
V
FS
R
IN
C
IN
A
VTC
V
OS
E
G
V
CM
435
Differential
Differential
Differential
Full Temp
-10.0
1.40
1.47
500
1.9
90
±2.0
±2.0
535
635
10.0
1.54
V
P-P
Ω
pF
ppm/°C
mV
%
mV
SYMBOL
CONDITIONS
MIN
TYP
MAX
UNITS
4
FN6805.3
October 9, 2009
KAD5512P-50
Electrical Specifications
All specifications apply under the following conditions unless otherwise noted: AVDD = 1.8V, OVDD = 1.8V,
T
A
= -40°C to +85°C (typical specifications at +25°C), A
IN
= -1dBFS, f
SAMPLE
= 500MSPS.
(Continued)
KAD5512P-50
(Note 2)
PARAMETER
Signal-to-Noise Ratio
SYMBOL
SNR
CONDITIONS
f
IN
= 10MHz
f
IN
= 105MHz
f
IN
= 190MHz
f
IN
= 364MHz
f
IN
= 695MHz
f
IN
= 995MHz
Signal-to-Noise and Distortion
SINAD
f
IN
= 10MHz
f
IN
= 105MHz
f
IN
= 190MHz
f
IN
= 364MHz
f
IN
= 695MHz
f
IN
= 995MHz
Effective Number of Bits
ENOB
f
IN
= 10MHz
f
IN
= 105MHz
f
IN
= 190MHz
f
IN
= 364MHz
f
IN
= 695MHz
f
IN
= 995MHz
Spurious-Free Dynamic Range
SFDR
f
IN
= 10MHz
f
IN
= 105MHz
f
IN
= 190MHz
f
IN
= 364MHz
f
IN
= 695MHz
f
IN
= 995MHz
Intermodulation Distortion
IMD
f
IN
= 70MHz
f
IN
= 170MHz
Word Error Rate
Full Power Bandwidth
NOTES:
2. Parameters with Min and/or MAX limits are 100% production tested at their worst case temperature extreme ( +85°C).
3. Digital Supply Current is dependent upon the capacitive loading of the digital outputs. I
OVDD
specifications apply for 10pF load on each digital
output.
4. See “Nap/Sleep” on page 17 for more detail.
5. AC Specifications apply after internal calibration of the ADC is invoked at the given sample rate and temperature. Refer to “Power-On Calibration”
on page 14 and “User Initiated Reset” on page 15 for more detail.
6. SFDR, SINAD and ENOB specifications apply after gain error and timing skew between ADC cores have been minimized through external
calibration.
7. The DLL Range setting must be changed for low speed operation. See Table 15 on page 23 for more detail.
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