EV-VN5E025AJ provides you an easy way to connect ST’s surface mounted VIPower®drivers into your existing prototype circuitry. This evaluation board comes pre-assembled with VN5E025AJ-E high-side driver.
The VN5E025AJ-E is a single channel high-side driver manufactured using ST proprietary VIPower M0-5 technology and housed in PowerSSO-12 package. The VN5E025AJ-E is designed to drive 12 V automotive grounded loads, providing protection, diagnostics and easy 3 V and 5 V CMOS-compatible interface with any microcontroller.
The device integrates advanced protective functions such as load current limitation, inrush and overload active management by power limitation, overtemperature shutoff with autorestart and overvoltage active clamp. A dedicated analog current sense pin is associated with every output channel provides enhanced diagnostic functions including fast detection of overload and short-circuit to ground through power limitation indication, over temperature indication, short-circuit to VCCdiagnosis and ON-state and OFF-state open-load detection. The current sensing and diagnostic feedback of the whole device can be disabled by pulling the CS_DIS pin high to share the external sense resistor with similar devices.
Main features
All reference designs on this site are sourced from major semiconductor manufacturers or collected online for learning and research. The copyright belongs to the semiconductor manufacturer or the original author. If you believe that the reference design of this site infringes upon your relevant rights and interests, please send us a rights notice. As a neutral platform service provider, we will take measures to delete the relevant content in accordance with relevant laws after receiving the relevant notice from the rights holder. Please send relevant notifications to email: bbs_service@eeworld.com.cn.
It is your responsibility to test the circuit yourself and determine its suitability for you. EEWorld will not be liable for direct, indirect, special, incidental, consequential or punitive damages arising from any cause or anything connected to any reference design used.
Supported by EEWorld Datasheet