Triaxial Inertial Sensor
with Magnetometer
ADIS16400/ADIS16405
FEATURES
Triaxial, digital gyroscope with digital range scaling
±75°/sec, ±150°/sec, ±300°/sec settings
Tight orthogonal alighment, <0.05°
Triaxial, digital accelerometer, ±18
g
Triaxial, digital magnetometer, ±2.5 gauss
Autonomous operation and data collection
No external configuration commands required
220 ms start-up time
4 ms sleep mode recovery time
Factory-calibrated sensitivity, bias, and axial alignment
ADIS16400 calibration temperature: +25°C
ADIS16405 calibration temperature range: −40°C to +85°C
SPI-compatible serial interface
Embedded temperature sensor
Programmable operation and control
Automatic and manual bias correction controls
Bartlett-window FIR length, number of taps
Digital I/O: data-ready, alarm indicator, general-purpose
Alarms for condition monitoring
Sleep mode for power management
DAC output voltage
Enable external sample clock input up to 1.2 kHz
Single-command self-test
Single-supply operation: 4.75 V to 5.25 V
2000
g
shock survivability
Operating temperature range: −40°C to +105°C
APPLICATIONS
Unmanned aerial vehicles
Platform control
Digital compassing
Navigation
FUNCTIONAL BLOCK DIAGRAM
AUX_
ADC
TEMPERATURE
SENSOR
TRI-AXIS MEMS
ANGULAR RATE
SENSOR
CS
SIGNAL
CONDITIONING
AND
CONVERSION
CALIBRATION
AND
DIGITAL
PROCESSING
OUTPUT
REGISTERS
AND SPI
INTERFACE
SCLK
DIN
DOUT
TRI-AXIS MEMS
ACCELERATION
SENSOR
AUX_
DAC
TRI-AXIS
MAGNETIC
SENSOR
ALARMS
POWER
MANAGEMENT
VCC
SELF-TEST
DIGITAL
CONTROL
GND
07907-001
ADIS16405
RST DIO1 DIO2 DIO3 DIO4/
CLKIN
Figure 1.
GENERAL DESCRIPTION
The ADIS16400/ADIS16405
iSensor®
products are complete
inertial systems that include a triaxal gyroscope, a triaxial
accelerometer, and a triaxial magnetometer. The ADIS16400/
ADIS16405 combine industry-leading
iMEMS®
technology with
signal conditioning that optimizes dynamic performance. The
factory calibration characterizes each sensor for sensitivity, bias,
alignment, and linear acceleration (gyroscope bias). As a result,
each sensor has its own dynamic compensation for correction
formulas that provide accurate sensor measurements over a
temperature range of −40°C to +85°C. The magnetometers employ
a self-correction function to provide accurate bias performance
over temperature, as well.
The ADIS16400/ADIS16405 provide a simple, cost-effective
method for integrating accurate, multi-axis inertial sensing into
industrial systems, especially when compared with the
Rev. B
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
complexity and investment associated with discrete designs. All
necessary motion testing and calibration are part of the production
process at the factory, greatly reducing system integration time.
Tight orthogonal alignment simplifies inertial frame alignment
in navigation systems. An improved serial peripheral interface
(SPI) and register structure provide faster data collection and
configuration control. By using a compatible pinout and the
same package as the ADIS1635x and ADIS1636x families,
upgrading to the ADIS16400/ADIS16405 requires only firmware
changes to accommodate additional sensors and register map
updates.
These compact modules are approximately 23 mm × 23 mm ×
23 mm and provide a flexible connector interface that enables
multiple mounting orientation options.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2009 Analog Devices, Inc. All rights reserved.
ADIS16400/ADIS16405
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications ....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Specifications .................................................................. 6
Timing Diagrams.......................................................................... 6
Absolute Maximum Ratings............................................................ 7
ESD Caution .................................................................................. 7
Pin Configuration and Function Descriptions ............................. 8
Typical Performance Characteristics ............................................. 9
Theory of Operation ...................................................................... 10
Basic Operation .......................................................................... 10
Reading Sensor Data .................................................................. 10
Device Configuration ................................................................ 10
Burst Mode Data Collection ..................................................... 10
Memory Map .............................................................................. 11
Output Data Registers ............................................................... 12
Calibration................................................................................... 12
Operational Control................................................................... 13
Input/Output Functions ............................................................ 14
Diagnostics .................................................................................. 15
Outline Dimensions ....................................................................... 17
Ordering Guide .......................................................................... 17
REVISION HISTORY
7/09—Rev. A to Rev. B
Changes to Features Section............................................................ 1
Changes to Data Retention Parameter........................................... 4
Changes to Table 2 ............................................................................ 6
Changes to Figure 6 .......................................................................... 8
Changes to Device Configuration Section .................................. 10
Changes to Table 8 .......................................................................... 11
Changes to Table 9 and Added Default Value to Table 10,
Table 11, and Table 12 .................................................................... 12
Added Default Value to Table 13, and Table 15 and changes to
Internal Sample Rate Section and Table 15 ................................. 13
Added Default Value to Table 17, Table 18, and Table 19 and
Changes to Digital Filtering Section ............................................ 14
Added Default Value to Table 20 and Changes to Table 23 ...... 15
Added Default Value to Table 24, Table 25, and Table 26 and
Changes to Table 24 ........................................................................ 16
Changes to Ordering Guide .......................................................... 18
4/09—Rev. 0 to Rev. A
Added ADIS16400.............................................................. Universal
Changes to Features ..........................................................................1
Changes to Table 1.............................................................................3
Changes to Figure 5 and Figure 6 ....................................................8
Changes to Reading Sensor Data Section ................................... 10
Changes to Internal Sample Rate Section ................................... 13
Changes to Input/Output Functions Section.............................. 14
Changes to Digital Filtering Section ............................................ 14
Changes to Ordering Guide .......................................................... 17
3/09—Revision 0: Initial Version
Rev. B | Page 2 of 20
ADIS16400/ADIS16405
SPECIFICATIONS
T
A
= −40°C to +85°C, VCC = 5.0 V, angular rate = 0°/sec, dynamic range = ±300°/sec, ±1
g,
unless otherwise noted.
Table 1.
Parameter
GYROSCOPES
Dynamic Range
Initial Sensitivity
Test Conditions
Min
±300
0.0495
Typ
±350
0.05
0.025
0.0125
±250
±40
±0.05
±0.5
0.1
±3
0.007
2.0
±0.025
±0.01
0.05
0.32
0.9
0.05
330
Max
Unit
°/sec
°/sec/LSB
°/sec/LSB
°/sec/LSB
ppm/°C
ppm/°C
Degrees
Degrees
% of FS
°/sec
°/sec
°/√hr
°/sec/°C
°/sec/°C
°/sec/g
°/sec/V
°/sec rms
°/sec/√Hz rms
Hz
g
mg/LSB
ppm/°C
ppm/°C
Degrees
Degrees
% of FS
mg
mg
m/sec/√hr
mg/°C
mg/°C
mg/V
mg rms
mg/√Hz rms
Hz
gauss
mgauss/LSB
ppm/°C
Degrees
Degrees
% of FS
mgauss
mgauss/°C
mgauss rms
mgauss/√Hz
Hz
Sensitivity Temperature Coefficient
Misalignment
Nonlinearity
Initial Bias Error
In-Run Bias Stability
Angular Random Walk
Bias Temperature Coefficient
Linear Acceleration Effect on Bias
Bias Voltage Sensitivity
Output Noise
Rate Noise Density
3 dB Bandwidth
ACCELEROMETERS
Dynamic Range
Initial Sensitivity
Sensitivity Temperature Coefficient
Misalignment
Nonlinearity
Initial Bias Error
In-Run Bias Stability
Velocity Random Walk
Bias Temperature Coefficient
Bias Voltage Sensitivity
Output Noise
Noise Density
3 dB Bandwidth
MAGNETOMETER
Dynamic Range
Initial Sensitivity
Sensitivity Temperature Coefficient
Axis Nonorthogonality
Axis Misalignment
Nonlinearity
Initial Bias Error
Bias Temperature Coefficient
Output Noise
Noise Density
3 dB Bandwidth
Dynamic range = ±300°/sec
Dynamic range = ±150°/sec
Dynamic range = ±75°/sec
ADIS16400: −40°C ≤ T
A
≤ +85°C
ADIS16405: −40°C ≤ T
A
≤ +85°C
Axis-to-axis, Δ = 90° ideal
Axis-to-frame (package)
Best fit straight line
1σ
1 σ, SMPL_PRD = 0x01
1 σ, SMPL_PRD = 0x01
ADIS16400: −40°C ≤ T
A
≤ +85°C
ADIS16405: −40°C ≤ T
A
≤ +85°C
Any axis, 1 σ (MSC_CTRL, Bit 7 = 1)
VCC = 4.75 V to 5.25 V
±300°/sec range, no filtering
f = 25 Hz, ±300°/sec, no filtering
0.0505
±18
3.285
ADIS16400: −40°C ≤ T
A
≤ +85°C
ADIS16405: −40°C ≤ T
A
≤ +85°C
Axis-to-axis, Δ = 90° ideal
Axis-to-frame (package)
Best fit straight line, ±17
g
1σ
1σ
1σ
ADIS16400: −40°C ≤ T
A
≤ +85°C
ADIS16405: −40°C ≤ T
A
≤ +85°C
VCC = 4.75 V to 5.25 V
No filtering
No filtering
3.33
±120
±50
0.2
±0.5
0.1
±50
0.2
0.2
±1.35
±0.3
2.5
9
0.5
330
±3.5
0.5
600
0.25
0.5
0.5
±4
0.5
1.25
0.066
1540
3.38
25°C
25°C, 1 σ
25°C, axis-to-axis
25°C, axis-to-base plate and guide pins
Best fit straight line
25°C, 0 gauss stimulus
25°C, no filtering
25°C, no filtering, rms
±2.5
0.49
0.51
Rev. B | Page 3 of 20
ADIS16400/ADIS16405
Parameter
TEMPERATURE SENSOR
Scale Factor
ADC INPUT
Resolution
Integral Nonlinearity
Differential Nonlinearity
Offset Error
Gain Error
Input Range
Input Capacitance
DAC OUTPUT
Resolution
Relative Accuracy
Differential Nonlinearity
Offset Error
Gain Error
Output Range
Output Impedance
Output Settling Time
LOGIC INPUTS
1
Input High Voltage, V
INH
Input Low Voltage, V
INL
CS Wake-Up Pulse Width
Logic 1 Input Current, I
INH
Logic 0 Input Current, I
INL
All Pins Except RST
RST Pin
Input Capacitance, C
IN
DIGITAL OUTPUTS
1
Output High Voltage, V
OH
Output Low Voltage, V
OL
FLASH MEMORY
Data Retention
3
FUNCTIONAL TIMES
4
Power-On Start-Up Time
Reset Recovery Time
Sleep Mode Recovery Time
Flash Memory Test Time
Automatic Self-Test Time
CONVERSION RATE
Clock Accuracy
Sync Input Clock
Test Conditions
25°C, output = 0x0000
Min
Typ
0.14
12
±2
±1
±4
±2
0
During acquisition
20
12
±4
±1
±5
±0.5
0
5 kΩ/100 pF to GND
2.0
CS signal to wake up from sleep mode
20
V
IH
= 3.3 V
V
IL
= 0 V
±0.2
−40
−1
10
I
SOURCE
= 1.6 mA
I
SINK
= 1.6 mA
Endurance
2
T
J
= 85°C
Time until data is available
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
Normal mode, SMPL_PRD ≤ 0x09
Low power mode, SMPL_PRD ≥ 0x0A
SMPL_PRD = 0x01
SMPL_PRD = 0x01 to 0xFF
2.4
0.4
10,000
20
220
290
100
170
4
15
17
90
12
0.413
819.2
±3
1.2
±10
−60
0.8
0.55
2
10
3.3
3.3
Max
Unit
°C/LSB
Bits
LSB
LSB
LSB
LSB
V
pF
Bits
LSB
LSB
mV
%
V
Ω
μs
V
V
V
μs
μA
μA
mA
pF
V
V
Cycles
Years
ms
ms
ms
ms
ms
ms
ms
ms
SPS
%
kHz
Code 101 to Code 4095, 5 kΩ/100 pF to GND
Rev. B | Page 4 of 20
ADIS16400/ADIS16405
Parameter
POWER SUPPLY
Operating Voltage Range, VCC
Power Supply Current
Test Conditions
Min
4.75
Low power mode at 25°C
Normal mode at 25°C
Sleep mode at 25°C
Typ
5.0
45
70
600
Max
5.25
Unit
V
mA
mA
μA
1
2
The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C.
3
The data retention lifetime equivalent is at a junction temperature (T
J
) of 85°C as per JEDEC Standard 22, Method A117. Data retention lifetime decreases with junction
temperature.
4
These times do not include thermal settling and internal filter response times (330 Hz bandwidth), which may affect overall accuracy.
Rev. B | Page 5 of 20
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