II. Project Functionality
LDO (Low Dropout Linear Regulator) Selection:
The voltage divider resistors in this project are designed to be 220K+10K, therefore the voltage division ratio is 22:1 (ADC_IN11).
This project uses a low-side current sampling circuit for current detection. The low-side of the sampling circuit shares a common ground with the development board's meter interface. In the current wiring port circuit on the right side of the image, CN2 pins 1 and 2 are connected to TA and TI+ respectively (not shown on the schematic, but present on the PCB).
This project uses two 0.28-inch three-digit common-cathode digital tubes as display devices. Compared to displays, digital tubes offer better visibility in complex environments. Depending on the specific needs of the application environment, smaller current-limiting resistors can be used to achieve higher brightness. Furthermore, digital tubes possess better mechanical properties and are not as easily damaged by external forces as displays. They are widely used in industrial applications requiring stability and reliability. From a development board learning perspective, this makes it easier to purposefully learn about electronic measurement principles and related development.
All reference designs on this site are sourced from major semiconductor manufacturers or collected online for learning and research. The copyright belongs to the semiconductor manufacturer or the original author. If you believe that the reference design of this site infringes upon your relevant rights and interests, please send us a rights notice. As a neutral platform service provider, we will take measures to delete the relevant content in accordance with relevant laws after receiving the relevant notice from the rights holder. Please send relevant notifications to email: bbs_service@eeworld.com.cn.
It is your responsibility to test the circuit yourself and determine its suitability for you. EEWorld will not be liable for direct, indirect, special, incidental, consequential or punitive damages arising from any cause or anything connected to any reference design used.
Supported by EEWorld Datasheet