How to Test the Reliability of a MCU System[Copy link]
Readers want to know what methods are used to test the reliability of the MCU system. Deng Hongjie pointed out: "When a MCU system is designed, there will be different test items and methods for different MCU system products, but there are some that must be tested: 1. Test the completeness of the MCU software function. This is a test for all MCU system functions, and the test software is written correctly and completely. 2. Power-on and power-off test. During use, users will inevitably encounter power-on and power-off situations. The power supply can be switched on and off multiple times to test the reliability of the MCU system. 3. Aging test. Test the reliability of the MCU system under long-term working conditions. If necessary, it can be placed in a high temperature, high voltage and strong electromagnetic interference environment for testing. 4. ESD and EFT tests. Various interference simulators can be used to test the reliability of the MCU system. For example, an electrostatic simulator is used to test the ESD resistance of the MCU system; a surge noise simulator is used to perform fast pulse anti-interference EFT tests, etc. Deng Hongjie emphasized: "It is also possible to simulate the damage that may occur during human use. For example, the contact port of the MCU system can be deliberately rubbed with the human body or clothing fabric to test the anti-static ability. Use a high-power electric drill to work close to the microcontroller system to test its anti-electromagnetic interference capability, etc.