5962-9065804JX datasheet, PDF - EEWORLD Datasheet

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5962-9065804JX: DescriptionUVPROM, 4KX8, 35ns, CMOS, CDIP24, CERAMIC, DIP-24; Categorystorage storage; File Size54KB，13 Pages; ManufacturerWaferscale Integration Inc.

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5962-9065804JX Overview

UVPROM, 4KX8, 35ns, CMOS, CDIP24, CERAMIC, DIP-24

5962-9065804JX Parametric

Parameter Name	Attribute value
package instruction	CERAMIC, DIP-24
Reach Compliance Code	unknown
Maximum access time	35 ns
I/O type	COMMON
JESD-30 code	R-GDIP-T24
memory density	32768 bit
Memory IC Type	UVPROM
memory width	8
Number of functions	1
Number of terminals	24
word count	4096 words
character code	4000
Operating mode	ASYNCHRONOUS
Maximum operating temperature	125 °C
Minimum operating temperature	-55 °C
organize	4KX8
Output characteristics	3-STATE
Package body material	CERAMIC, GLASS-SEALED
encapsulated code	DIP
Encapsulate equivalent code	DIP24,.6
Package shape	RECTANGULAR
Package form	IN-LINE
Parallel/Serial	PARALLEL
power supply	5 V
Certification status	Not Qualified
Filter level	MIL-STD-883
Maximum standby current	0.035 A
Maximum slew rate	0.05 mA
Maximum supply voltage (Vsup)	5.5 V
Minimum supply voltage (Vsup)	4.5 V
Nominal supply voltage (Vsup)	5 V
surface mount	NO
technology	CMOS
Temperature level	MILITARY
Terminal form	THROUGH-HOLE
Terminal pitch	2.54 mm
Terminal location	DUAL
Base Number Matches	1

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REVISIONS

LTR

DESCRIPTION

DATE

(YR-MO-DA)

APPROVED

REV

SHEET

REV

SHEET

REV STATUS

OF SHEETS

REV

SHEET

PREPARED BY

Gary L. Gross

PMIC N/A

DEFENSE ELECTRONICS SUPPLY CENTER

DAYTON, OHIO 45444

STANDARDIZED

MILITARY

DRAWING

THIS DRAWING IS AVAILABLE

FOR USE BY ALL

DEPARTMENTS

AND AGENCIES OF THE

DEPARTMENT OF DEFENSE

CHECKED BY

Ray Monnin

APPROVED BY

Michael A. Frye

MICROCIRCUIT, MEMORY, DIGITAL, CMOS,

4K X 8-BIT UVEPROM, MONOLITHIC

SILICON

DRAWING APPROVAL DATE

92-09-11

SIZE

REVISION LEVEL

CAGE CODE

AMSC N/A

SHEET

67268

5962-90658

DESC FORM 193

JUL 91

DISTRIBUTION STATEMENT A. Approved for public release; distribution is unlimited.

5962-E591-92

2. APPLICABLE DOCUMENTS

2.1 Government specification, standards, and bulletin. Unless otherwise specified, the following specification, standards, and

bulletin of the issue listed in that issue of the Department of Defense Index of Specifications and Standards specified in the

solicitation, form a part of this drawing to the extent specified herein.

SPECIFICATION

MILITARY

MIL-M-38510

STANDARD

MILITARY

MIL-STD-480

MIL-STD-883

MIL-STD-1835

BULLETIN

MILITARY

MIL-BUL-103

- List of Standardized Military Drawings (SMD's).

- Configuration Control-Engineering Changes, Deviations and Waivers.

- Test Methods and Procedures for Microelectronics.

- Microcircuit Case Outlines.

- Microcircuits, General Specification for.

(Copies of the specification, standards, and bulletin required by manufacturers in connection with specific acquisition functions

should be obtained from the contracting activity or as directed by the contracting activity.)

2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text of

this drawing shall take precedence.

3. REQUIREMENTS

3.1 Item requirements. The individual item requirements shall be in accordance with 1.2.1 of MIL-STD-883, "Provisions for the

use of MIL-STD-883 in conjunction with compliant non-JAN devices" and as specified herein.

3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified in

MIL-M-38510 and herein.

3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.2 herein.

3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.

3.2.3 Truth table. The truth table shall be as specified on figure 2.

3.2.3.1 Unprogrammed devices. The truth table for unprogrammed devices for contracts involving no altered item drawing shall

be as specified on figure 2. When required in groups A, B, C, or D (see 4.3), the devices shall be programmed by the manufacturer

prior to test. A minimum of 50 percent of the total number of cells shall be programmed or at least 25 percent of the total number of

cells to any altered item drawing.

3.2.3.2 Programmed devices. The truth table for programmed devices shall be as specified by an attached altered item drawing.

3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as

specified in table I and shall apply over the full case operating temperature range.

3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical tests

for each subgroup are described in table I.

SIZE

STANDARDIZED

MILITARY DRAWING

DEFENSE ELECTRONICS SUPPLY CENTER

DAYTON, OHIO 45444

DESC FORM 193A

JUL 91

REVISION LEVEL

5962-90658

SHEET

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