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[color=#000][backcolor=rgb(232, 243, 253)][font=Helvetica, Arial, sans-serif][size=12px][url=https://en.eeworld.com/bbs/thread-414607-1-1.html]BUG due to insufficient care[/url][/size][/font][/backcol
As semiconductor manufacturers move to 65nm technology and look ahead to smaller nodes, serious test challenges are beginning to emerge. Now, process development engineers must abandon the benign worl
[align=left][color=#000] Smart homes and home automation are the main drivers of the IoT revolution, and access control systems have become one of the prominent applications in this area. One of the m
[align=left][color=#000000] A mixed signal oscilloscope (MSO) combines the performance of a DPO with the basic functions of a 16-channel logic analyzer, including parallel/serial bus protocol decoding